Progress In Electromagnetics Research
ISSN: 1070-4698, E-ISSN: 1559-8985
Home | Search | Notification | Authors | Submission | PIERS Home | EM Academy
Home > Vol. 92 > pp. 17-32


By U. C. Hasar

Full Article PDF (252 KB)

The constitutive parameters measurement of thin solid and liquid materials by transmission-reflection methods generally suffers from a) the requirement of the transformation of measured scattering parameters from the reference plane to the end surfaces of the material (measurement plane) and b) inaccurate knowledge on the length of the material, if the material does not fill the entire measurement cell (a waveguide or coaxial-line section). In this research paper, a microwave waveguide method for constitutive parameters determination of these materials is proposed to simultaneously eliminate these problems. There are three main advantages of the proposed method as: a) it explicitly determines the constitutive parameters from measured S-parameters; b) it does not require the knowledge about sample length since it directly measures it as a byproduct of the method; and c) it offers a self-checking feature to trace the performance and accurateness of measurements. This feature does not depend on the constitutive parameters of the sample. We measured the complex permittivity of some thin solid and liquid test samples for validation of the method.

U. C. Hasar, "Thickness-independent automated constitutive parameters extraction of thin solid and liquid materials from waveguide measurements," Progress In Electromagnetics Research, Vol. 92, 17-32, 2009.

1. Nyfors, E. G. and P. Vainikainen, Industrial Microwave Sensors, Artech House, Inc., Norwood, MA, 1989.

2. Chen, L. F., et al., Microwave Electronics: Measurement and Materials Characterization, JohnWiley & Sons, West Sussex, England, 2004.

3. Hebeish, A. A., et al., "Factors affecting the performance of the radar absorbant textile materials of different types and structures," Progress In Electromagnetics Research B, Vol. 3, 219-226, 2008.

4. Zhang, H., S. Y. Tan, and H. S. Tan, "An improved method for microwave nondestructive dielectric measurement of layered media," Progress In Electromagnetics Research B, Vol. 10, 145-161, 2008.

5. Pozar, D. M., Microwave Engineering, John Wiley & Sons, Inc., New York, NY, 2005.

6. Rubinger, C. P. L. and L. C. Costa, "Building a resonant cavity for the measurement of microwave dielectric permittivity of high loss materials," Microwave Opt. Tech. Lett., Vol. 49, 1687-1690, 2007.

7. Williams, T. C., M. A. Stuchly, and P. Saville, "Modified transmission-reflection method for measuring constitutive parameters of thin flexible high-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 51, 1560-1566, 2003.

8. Courtney, C. C. and W. Motil, "One-port time-domain measurement of the approximate permittivity and permeability of materials," IEEE Trans. Microw. Theory Tech., Vol. 47, 551-555, 1999.

9. Weir, W. B., "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, Vol. 62, 33-36, 1974.

10. Nicolson, A. M. and G. Ross, "Measurement of the intrinsic properties of materials by time-domain techniques," IEEE Trans. Instrum. Meas., Vol. 19, 377-382, 1970.

11. Packard, H., "Measuring dielectric constant of solids with the HP 8510 network analyzer,", Product Note 8510-3, 1985.

12. Baker-Jarvis, J., E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., Vol. 38, 1096-1103, 1990.

13. Baker-Jarvis, J., M. D. Janezic, J. H. Grosvenor, Jr., and R. G. Geyer, "Transmission/reflection and short-circuit line methods for measuring permittivity and permeability,", NIST, Boulder, CO, Tech. Note 1355, 1992.

14. Bois, K. J., L. F. Handjojo, A. D. Benally, K. Mubarak, and R. Zoughi, "Dielectric plug-loaded two-port transmission line measurement technique for dielectric property characterization of granular and liquid materials," IEEE Trans. Instrum. Meas., Vol. 48, 1141-1148, 1999.

15. Wang, Y. and M. N. Afsar, "Measurement of complex permittivity of liquids using waveguide techniques," Progress In Electromagnetics Research, PIER 42, 131-142, 2003.

16. Folgero, K., "Broad-band dielectric spectroscopy of lowpermittivity fluids using one measurement cell," IEEE Trans. Instrum. Meas., Vol. 47, 881-885, 1998.

17. Qaddoumi, N., S. Ganchev, and R. Zoughi, "Microwave diagnosis of low density glass fibers with resin binder," Res. Nondestruc. Eval., Vol. 8, 177-188, 1996.

18. Hasar, U. C., "Calibration-independent method for complex permittivity determination of liquid and granular materials," Electron. Lett., Vol. 44, 585-587, 2008.

19. Baker-Jarvis, J., M. D. Janezic, and C. A. Jones, "Shielded opencircuited sample holder for dielectric measurements of solids and liquids," IEEE Trans. Instrum. Meas., Vol. 47, 338-344, 1998.

20. Vanzura, E. J., J. Baker-Jarvis, J. H. Grosvenor, and M. Janezic, "Intercomparison of permittivity measurements using the transmission/reflection method in 7-mm coaxial transmission lines," IEEE Trans. Microw. Theory Tech., Vol. 42, 2063-2070, 1994.

21. Mattar, K. E., D. G. Watters, and M. E. Brodwin, "Influence of wall contacts on measured complex permittivity spectra at coaxial line frequencies," IEEE Trans. Microw. Theory Tech., Vol. 39, 532-537, 1991.

22. Somlo, P. I., "A convenient self-checking method for the automated microwave measurement of μ and ε," IEEE Trans. Instrum. Meas., Vol. 42, 213-216, 1993.

23. Sjoberg, D., "Determination of propagation constants and material data from waveguide measurements," Progress In Electromagnetics Research B, Vol. 12, 163-182, 2009.

24. Hasar, U. C., "Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials," Meas. Sci. Techol., Vol. 19, 055706-055715, 2008.

25. Hasar, U. C., "A fast and accurate amplitude-only transmissionreflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 56, 2129-2135, 2008.

26. Hasar, U. C. and C. R. Westgate, "A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 57, 471-477, 2009.

27. Hasar, U. C. and O. Simsek, "An accurate complex permittivity method for thin dielectric materials," Progress In Electromagnetics Research, PIER 91, 123-183, 2009.

28. Buyukozturk, O., T. Y. Yu, and J. A. Ortega, "A methodology for determining complex permittivity of construction materials based on transmission-only coherent, wide-bandwidth free-space measurements," Cem. Concr. Compos., Vol. 28, 349-359, 2006.

29. Ebara, H., T. Inoue, and O. Hashimoto, "Measurement method of complex permittivity and permeability for a powdered material using a waveguide in microwave band," Sci. Technol. Adv. Mat., Vol. 7, 77-83, 2006.

30. Press, W. H., S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C: The Art of Scientific Computing, Cambridge University Press, New York, 1992.

31. Balanis, C. A., Advanced Engineering Electromagnetics, John Wiley & Sons, New Jersey, NJ, 1989.

32. Deshpande, M. D., C. J. Reddy, P. I. Tiemsin, and R. Cravey, "A new approach to estimate complex permittivity of dielectric materials at microwave frequencies using waveguide measurements," IEEE Trans. Microw. Theory Tech., Vol. 45, 359-365, 1997.

33. Nishikata, A., "A swept-frequency measurement of complex permittivity and complex permeability of a columnar specimen inserted in a rectangular waveguide," IEEE Trans. Microw. Theory Tech., Vol. 55, 1554-1567, 2007.

34. He, X., Z. Tang, B. Zhang, and Y. Wu, "A new deembedding method in permittivity measurement of ferroelectric thin film material," Progress In Electromagnetics Research Letters, Vol. 3, 1-8, 2008.

35. Wu, Y., Z. Tang, Y. Yu, and X. He, "A new method to avoid acrowding phenomenon in extracting the permittivity of ferroelectric thin films," Progress In Electromagnetics Research Letters, Vol. 4, 159-166, 2008.

36. Hasar, U. C. and O. Simsek, "A simple approach for evaluating the reciprocity of materials without using any calibration standard," Progress In Electromagnetics Research, PIER 91, 139-152, 2009.

37. Engen, G. F. and C. A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Microw. Theory and Tech., Vol. 27, 987-993, 1979.

38. Hasted, J. B., Aqueous Dielectrics, Chapman and Hall, London, UK, 1973.

39. Chin, G. Y. and E. A. Mechtly, "Properties of materials," Reference Data for Engineering: Radio, Electronics, Computer, and Communications, E. C. Jordan (ed.), 4-20–4-23, Howard W. Sams & Co., Indianapolis, IN, 1986.

40. Von Hippel, A. R., Dielectric Materials and Applications, 134-135, 310-332, John Wiley & Sons, New York, NY, 1954.

© Copyright 2014 EMW Publishing. All Rights Reserved