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PROCEDURE FOR ACCURATE AND STABLE CONSTITUTIVE PARAMETERS EXTRACTION OF MATERIALS AT MICROWAVE FREQUENCIES

By U. C. Hasar

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Abstract:
A non-resonant microwave method has been proposed for accurate and stable constitutive parameter measurement of low-loss dispersive and non-dispersive isotropic materials. The method uses transmission-only measurements of two configurations: a) the sample inside a sample holder and b) the sample backed by a reference sample inside the same holder. It is not prone to undesired ripples in the extracted constitutive parameters arising from measured similar reflection properties. In addition, its accuracy is higher since it is not much affected by surface roughness and/or unevenness of the sample or the reference sample. It is based on frequency-by-frequency extraction and thus suitable for dispersive materials. However, it requires the selection of an appropriate reference sample. The method has been validated by measurements at Xband (8.2--12.4 GHz) of a low-loss sample located into a waveguide sample holder.

Citation:
U. C. Hasar, "Procedure for Accurate and Stable Constitutive Parameters Extraction of Materials at Microwave Frequencies," Progress In Electromagnetics Research, Vol. 109, 107-121, 2010.
doi:10.2528/PIER10083006
http://www.jpier.org/PIER/pier.php?paper=10083006

References:
1. Kaatze, U., "Techniques for measuring the microwave dielectric properties of materials," Metrologia, Vol. 47, No. 2, S91-S113, 2010.
doi:10.1088/0026-1394/47/2/S10

2. Zhang, H., S. Y. Tan, and H. S. Tan, "A novel method for microwave breast cancer detection," Progress In Electromagnetics Research, Vol. 83, 413-434, 2008.
doi:10.2528/PIER08062701

3. Zhang, H., S. Y. Tan, and H. S. Tan, "An improved method for microwave nondestructive dielectric measurement of layered media," Progress In Electromagnetics Research B, Vol. 10, 145-161, 2008.
doi:10.2528/PIERB08082701

4. Le Floch, J. M., F. Houndonougbo, V. Madrangeas, D. Cros, M. Guilloux-Viry, and W. Peng, "Thin film materials characterization using TE modes," Journal of Electromagnetic Waves and Applications, Vol. 23, No. 4, 549-559, 2009.
doi:10.1163/156939309787612293

5. Jin, H., S. R. Dong, and D. M. Wang, "Measurement of dielectric constant of thin film materials at microwave frequencies," Journal of Electromagnetic Waves and Applications, Vol. 23, No. 5-6, 809-817, 2009.
doi:10.1163/156939309788019831

6. Wu, Y. Q., Z. X. Tang, Y. H. Xu, and B. Zhang, "Measuring complex permeability of ferromagnetic thin films using microstrip transmission method," Journal of Electromagnetic Waves and Applications, Vol. 23, No. 10, 1303-1311, 2009.
doi:10.1163/156939309789108598

7. Wu, Y. Q., Z. X. Tang, Y. H. Xu, X. He, and B. Zhang, "Permittivity measurement of ferroelectric thin film based on CPW transmission line," Journal of Electromagnetic Waves and Applications, Vol. 22, No. 4, 555-562, 2008.
doi:10.1163/156939308784150272

8. Hasar, U. C., "Accurate complex permittivity inversion from measurements of a sample partially filling a waveguide aperture," IEEE Trans. Microw. Theory Tech., Vol. 58, No. 2, 451-457, 2010.
doi:10.1109/TMTT.2009.2038444

9. Challa, R. K., et al., "Permittivity measurement with a non-standard waveguide by using TRL calibration and fractional linear data fitting," Progress In Electromagnetics Research B, Vol. 2, 1-13, 2008.
doi:10.2528/PIERB07102001

10. Hasar, U. C. and A. Cansiz, "Simultaneous complex permittivity and thickness evaluation of liquid materials from scattering parameter measurements," Microw. Opt. Technol. Lett., Vol. 52, No. 1, 75-78, 2010.
doi:10.1002/mop.24837

11. Wu, Y., Z. Tang, Y. Yu, and X. He, "A new method to avoid crowding phenomenon in extracting the permittivity of ferroelectric thin films," Progress In Electromagnetics Research Letters, Vol. 4, 159-166, 2008.
doi:10.2528/PIERL08091402

12. Zainud-Deen, S. H., M. E. S. Badr, E. El-Deen, and K. H. Awadalla, "Microstrip antenna with corrugated ground plane surface as a sensor for landmines detection," Progress In Electromagnetics Research B, Vol. 2, 259-278, 2008.
doi:10.2528/PIERB07112702

13. Hasar, U. C., "A new method for evaluation of thickness and monitoring its variation of medium- and low-loss materials," Progress In Electromagnetics Research, Vol. 94, 403-418, 2009.
doi:10.2528/PIER09061504

14. Hasar, U. C., "Thickness-independent complex permittivity determination of partially filled thin dielectric materials into rectangular waveguides," Progress In Electromagnetics Research, Vol. 93, 183-203, 2009.

15. Hasar, U. C., "Thickness-independent automated constitutive parameters extraction of thin solid and liquid materials from waveguide measurements," Progress In Electromagnetics Research, Vol. 92, 17-32, 2009.
doi:10.2528/PIER09031606

16. He, X., Z. X. Tang, B. Zhang, and Y. Q.Wu, "A new deembedding method in permittivity measurement of ferroelectric thin film material," Progress In Electromagnetics Research Letters, Vol. 3, 1-8, 2008.
doi:10.2528/PIERL08011501

17. Hasar, U. C. and O. Simsek, "A calibration-independent microwave method for position-insensitive and nonsingular dielectric measurements of solid materials," J. Phys. D: Appl. Phys., Vol. 42, No. 7, 075403(10), 2009.

18. Kharkovsky, S. N., M. F. Akay, U. C. Hasar, and C. D. Atis, "Measurement and monitoring of microwave reflection and transmission properties of cement-based materials," IEEE Trans. Instrum. Meas., Vol. 51, No. 6, 1210-1218, 2002.
doi:10.1109/TIM.2002.808081

19. Hasar, U. C., "Permittivity determination of fresh cement-based materials by an open-ended waveguide probe using amplitude-only measurements," Progress In Electromagnetics Research, Vol. 97, 27-43, 2009.
doi:10.2528/PIER09071409

20. Hasar, U. C., O. Simsek, and A. C. Aydin, "Application of varying-frequency amplitude-only technique for electrical characterization of hardened cement-based materials," Microw. Opt. Tehcnol. Lett., Vol. 52, No. 4, 801-805, 2010.
doi:10.1002/mop.25057

21. Hasar, U. C., "Non-destructive testing of hardened cement specimens at microwave frequencies using a simple free-space method," NDT & E Int., Vol. 42, No. 6, 550-557, 114703(4), 2009.
doi:10.1016/j.ndteint.2009.04.004

22. Hasar, U. C., "A microcontroller-based microwave free-space measurement system for permittivity determination of lossy liquid materials," Rev. Sci. Instrum., Vol. 80, No. 5, 056103(3), 2009.

23. Hasar, U. C. and O. Simsek, "An accurate complex permittivity method for thin dielectric materials," Progress In Electromagnetics Research, Vol. 91, 123-138, 2009.
doi:10.2528/PIER09011702

24. Nicolson, A. M. and G. Ross, "Measurement of the intrinsic properties of materials by timedomain techniques," IEEE Trans. Instrum. Meas., Vol. 19, No. 4, 377-382, 1970.
doi:10.1109/TIM.1970.4313932

25. Weir, W. B., "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, Vol. 62, No. 1, 33-36, 1974.
doi:10.1109/PROC.1974.9382

26. Smith, D. R. and S. Schultz, "Determination of effective permittivity and permeability of metamaterials from reflection and transmission coefficients," Phys. Rev. B, Vol. 65, 195104(5), 2002.

27. Baker-Jarvis, J., E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., Vol. 38, No. 8, 1096-1103, 1990.
doi:10.1109/22.57336

28. Boughriet, A. H., C. Legrand, and A. Chapoton, "Noniterative stable transmission/reflection method for lowloss material complex permittivity determination," IEEE Trans. Microw. Theory Tech., Vol. 45, No. 1, 52-57, 1997.
doi:10.1109/22.552032

29. Hasar, U. C., "A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 56, No. 9, 2129-2135, 2008.
doi:10.1109/TMTT.2008.2002229

30. Hasar, U. C., C. R. Westgate, and M. Ertugrul, "Noniterative permittivity extraction of lossy liquid materials from reflection asymmetric amplitude-only microwave measurements," IEEE Microw. Wireless Compon. Lett., Vol. 19, No. 6, 419-421, 2009.
doi:10.1109/LMWC.2009.2020045

31. Hasar, U. C., C. R. Westgate, and M. Ertugrul, "Permittivity determination of liquid materials using waveguide measurements for industrial applications," IET Microw. Antennas Propagat., Vol. 4, No. 1, 141-152, 2010.
doi:10.1049/iet-map.2008.0197

32. Hasar, U. C. and O. E. Inan, "Elimination of the dependency of the calibration plane and the sample thickness from complex permittivity measurements of thin materials," Microw. Opt. Technol. Lett., Vol. 51, No. 7, 1642-1646, 2009.
doi:10.1002/mop.24445

33. Hasar, U. C. and C. R. Westgate, "A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 57, No. 2, 471-477, 2009.
doi:10.1109/TMTT.2008.2011242

34. Hasar, U. C., "Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials," Meas. Sci. Technol., Vol. 19, No. 5, 055706(10), 2008.

35. Hasar, U. C., "Elimination of the multiple-solutions ambiguity in permittivity extraction from transmission-only measurements of lossy materials," Microw. Opt. Technol. Lett., Vol. 51, No. 2, 337-341, 2009.
doi:10.1002/mop.24048

36. Mahony, J. D., "Measurements to estimate the relative permittivity and loss tangent of thin, low-loss materials," IEEE Antennas Propag. Mag., Vol. 47, No. 3, 83-87, 2005.
doi:10.1109/MAP.2005.1532552

37. Muqaibel, A. H. and A. Safaai-Jazi, "A new formulation for characterization of materials based on measured insertion transfer function," IEEE Trans. Microw. Theory Tech., Vol. 51, No. 8, 1946-1951, 2003.
doi:10.1109/TMTT.2003.815274

38. Hasar, U. C., "A generalized formulation for permittivity extraction of low-to-high-loss materials from transmission measurement," IEEE Trans. Microw. Theory Tech., Vol. 58, No. 2, 411-418, 2010.
doi:10.1109/TMTT.2009.2038443

39. Ness, J., "Broad-band permittivity measurements using the semi-automatic network analyzer," IEEE Trans. Microw. Theory Tech., Vol. 33, No. 11, 1222-1226, 1985.
doi:10.1109/TMTT.1985.1133198

40. Ball, J. A. R. and B. Horsfield, "Resolving ambiguity in broadband waveguide permittivity measurements on moist materials," IEEE Trans. Instrum. Meas., Vol. 47, No. 2, 390-392, 1998.
doi:10.1109/19.744179

41. Xia, S., Z. Xu, and X. Wei, "Thickness-induced resonance-based complex permittivity measurement technique for barium strontium titanate ceramics at microwave frequency," Rev. Sci. Instrum., Vol. 80, No. 11, 114703(4), 2009.

42. Hasar, U. C., "Unique permittivity determination of low-loss dielectric materials from transmission measurements at microwave frequencies," Progress In Electromagnetics Research, Vol. 107, 31-46, 2010.
doi:10.2528/PIER10060805

43. Hasar, U. C., "A new microwave method based on transmission scattering parameter measurements for simultaneous broadband and stable permittivity and permeability determination," Progress In Electromagnetics Research, Vol. 93, 161-176, 2009.
doi:10.2528/PIER09041405

44. Hasar, U. C., "A microwave method for noniterative constitutive parameters determination of thin low-loss of lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 57, No. 6, 1595-1601, 2009.
doi:10.1109/TMTT.2009.2020779

45. Chen, X., B.-I. Wu, J. A. Kong, and T. M. Grzegorczyk, "Retrieval of the effective constitutive parameters of bianisotropic metamaterials," Phys. Rev. E, Vol. 71, 046610(9), 2005.

46. Li, Z., K. Aydin, and E. Ozbay, "Determination of the effective constitutive parameters of bianisotropic metamaterials from reflection and transmission measurements," Phys. Rev. E., Vol. 79, 026610(7), 2009.

47. Hasar, U. C., "A microwave method for accurate and stable retrieval of constitutive parameters of low- and medium-loss materials," IEEE Microw. Wireless Compon. Lett., Vol. 20, Dec. 2010.

48. Somlo, P. I. and J. D. Hunter, "Condition for reflection coefficient magnitude greater than one for passive transmission line and passive load," IEEE Trans. Instrum. Meas., Vol. 30, No. 3, 230-231, 1981.

49. Baker-Jarvis, J., M. D. Janezic, J. H. Grosvenor, Jr., and R. G. Geyer, "Transmission/reflection and short-circuit line methods for measuring permittivity and permeability,", NIST, Tech. Note, 1355, Boulder, CO, 1992.

50. Engen, G. F. and C. A. Hoer, "Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microw. Theory Tech., Vol. 27, No. 12, 987-993, 1979.
doi:10.1109/TMTT.1979.1129778

51. Von Hippel, A. R., Dielectric Materials and Applications, 134-135, 310-332, John Wiley & Sons, New York, 1954.


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