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Progress In Electromagnetics Research
ISSN: 1070-4698, E-ISSN: 1559-8985
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A HIGH ORDER INTEGRAL SPM FOR THE CONDUCTING ROUGH SURFACE SCATTERING WITH THE TAPERED WAVE INCIDENCE-TE CASE

By L.-X. Guo, Y. Liang, J. Li, and Z.-S. Wu

Full Article PDF (364 KB)

Abstract:
Based on the Helmholtz integral equation and series expansion theory, a high order integral small perturbation method (HISPM) for studying electromagnetic wave scattering from the finite conducting rough surface with tapered transverse electric (TE) wave incidence is presented. The high order scattering coefficients are obtained by the series expansion, the validity and accuracy of HISPM is verified through numerical evaluation with classical small perturbation method (CSPM) and the method of moments (MOM). By comparing with CSPM for the infinite rough surface case with plane wave incidence, the presented HISPM can greatly reduce the edge diffraction effect. HISPM also shows advantages in the memory requirement and computational time, especially in calculating scattering coefficients with low grazing angle incidence. Numerical examples are given to show that with the increasing of the length of the rough surface, the memory requirements and the computation time of HISPM are dramatically reduced compared to those of MOM.

Citation:
L.-X. Guo, Y. Liang, J. Li, and Z.-S. Wu, "A High Order Integral SPM for the Conducting Rough Surface Scattering with the Tapered Wave Incidence-TE Case," Progress In Electromagnetics Research, Vol. 114, 333-352, 2011.
doi:10.2528/PIER11011605
http://www.jpier.org/PIER/pier.php?paper=11011605

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