PIER
 
Progress In Electromagnetics Research
ISSN: 1070-4698, E-ISSN: 1559-8985
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CRITICAL MODEL COMPONENTS AND THEIR FINGERPRINT FEATURES IN THE SIMULATED CONDUCTED RADIO FREQUENCY IMMUNITY OF COMPLEX INTEGRATED CIRCUITS

By T. Su, Y. Yang, and Z. Wang

Full Article PDF (970 KB)

Abstract:
To analyze and to handle the radio frequency immunity of microcontrollers requires understanding the origins of the complex frequency response of the immunity. This paper assumes that the frequency response of the immunity can be characterized with a set of fingerprint features in the immunity curves. Positions and shapes of those fingerprint features are determined by certain components in the disturbance propagation network. In order to prove that assumption, a series of models are created and simulated. The roles of various model components on the immunity are analyzed by comparing the simulation results from different model structures. The fingerprint features on the immunity curves are identified. The paper shows how to treat a wide-range immunity curve with separated features. It also shows the responsible model components for those separated features. With the awareness of those features and their origins, researchers can concentrate on extracting the models of the most important components in the disturbance propagation network when modeling the immunity of the complex integrated circuits like microcontrollers.

Citation:
T. Su, Y. Yang, and Z. Wang, "Critical Model Components and Their Fingerprint Features in the Simulated Conducted Radio Frequency Immunity of Complex Integrated Circuits," Progress In Electromagnetics Research, Vol. 139, 689-720, 2013.
doi:10.2528/PIER13040201
http://www.jpier.org/PIER/pier.php?paper=13040201

References:
1. , , "Integrated Circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions,", IEC Standard IEC 62132-1, 2006.

2. , , "EMC IC modeling - Part 4: Models of integrated circuits for EMI behavioural simulation, conducted immunity modelling (ICIM-CI),", IEC Standard Proposal, Future IEC 62433-4, 2012.

3. Richardson, R. E., V. G. Puglielli, and R. A. Amadori, "Microwave interference effect in bipolar transistor," IEEE Transactions on Electromagnetic Compatibility, Vol. 17, 216-219, November 1975.

4. Joester, M., F. Klotz, W. Pfaff, and T. Steinecke, "Generic IC EMC test specification ,", German Electrical and Electronic Manufactures' Association, Frankfurt, Germany, 2010.
doi:10.1109/TEMC.2004.831816

5. , , "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 4: Direct RF power injection method,", IEC Standard IEC 62132-4, 2006.

6. Camp, M., H. Gerth, H. Garbe, and H. Haase, "Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis," IEEE Transactions on Electromagnetic Compatibility, Vol. 46, 368-379, February 2004.

7. Stievano, I., E. Vialardi, and F. Canavero, "Behavioral macromodels of digital integrated circuits for RF immunity prediction," Proceedings of 18th International Zurich Symposium on Electromagnetic Compatibility, 5-8, Zurich, 2007.

8. Ceperic, V. and A. Baric, "Modelling of electromagnetic immunity of integrated circuits by artificial neural networks," Proceedings of 20th International Zurich Symposium on Electromagnetic Compatibility, 373-376, Zurich, 2009.

9. Takahashi, E., O. Shibata, Y. Fukumoto, T. Yaneda, and H. Benno, "Evaluation of LSI immunity to noise using equivalent internal impedance model," Proceedings of EMC Europe International Symposium on Electromagnetic Compatibility of Integrated Circuits, September 2002.

10. Baffreau, S. and E. Sicard, "On the modeling of microcontrollers immunity to radio frequency interference," Proceedings of EMC COMPO International Workshop on Electromagnetic Compatibility of Integrated Circuits, November 2002.

11. Baffreau, S., S. Bendhia, M. Mamdani, and E. Sicard, "On the susceptibility of micro-controller to radio frequency interference," Proceedings of EMC COMPO International Workshop on Electromagnetic Compatibility of Integrated Circuits, March 2004.

12. Ichikawa, K., M. Inagaki, Y. Sakura, I. Iwase, M. Nagata, and O.Wada, "Simulation of integrated circuit immunity with LECCS model," Proceedings of 17th International Zurich Symposium on Electromagnetic Compatibility, 308-311, February 2006.
doi:10.1109/TEMC.2007.911920

13. Boyer, A., S. Bendhia, and E. Sicard, "Modelling of a direct power injection aggression on a 16 bit microcontroller input buffer," Proceedings of EMC COMPO International Workshop on Electromagnetic Compatibility of Integrated Circuits, Torino, 2007.
doi:10.1109/TEMC.2009.2023670

14. Alaeldine, A., R. Perdriau, M. Ramdani, J. Levant, and M. Drissi, "A direct power injection model for immunity prediction in integrated circuits," IEEE Transactions on Electromagnetic Compatibility, Vol. 50, 52-62, February 2008.

15. Koo, J., L. Han, S. Herrin, R. Moseley, R. Carlton, D. Beetner, and D. Pommerenke, "A nonlinear microcontroller power distribution network model for the characterization of immunity to electrical fast transients," IEEE Transactions on Electromagnetic Compatibility, Vol. 51, 611-619, August 2009.
doi:10.1016/j.microrel.2011.07.053

16. Lafon, F., F. de-Daran, M. Ramdani, R. Perdriau, and M. Drissi, "Immunity modeling of integrated circuits: An industrial case," Proceedings of EMC COMPO International Workshop on Electromagnetic Compatibility of Integrated Circuits, Zurich, 2009.

17. Grosa, J.-B., G. Duchampa, A. Meressea, J.-L. Levantb, and C. Marot, "Control of the electromagnetic compatibility: An issue for IC reliability," Microelectronics Reliability, Vol. 51, 1493-1497, September-November 2011.
doi:10.2528/PIERL11061311

18. Su, T., M. Unger, T. Steinecke, and R. Weigel, "Using error-source switching (ESS) concept to analyze the conducted radio frequency electromagnetic immunity of microcontrollers," IEEE Transactions on Electromagnetic Compatibility, Vol. 54, 635-645, June 2012.

19. Holik, S. M., J. M. Arnold, and T. D. Drysdale, "Empirical mixing model for the electromagnetic modelling of on-chip interconnects," Progress In Electromagnetics Research Letters, Vol. 26, 1-9, 2011.
doi:10.1109/TEMC.2011.2178098

20. Zeljami, K., J. Gutierrez, J. P. Pascual, T. Fernandez, A. Tazon, and M. Boussouis, "Characterization and modeling of Schottky diodes up to 110 GHz for use in both flip-chip and wire-bonded assembled environments," Progress In Electromagnetics Research, Vol. 131, 457-475, 2012.

21. Su, T., M. Unger, T. Steinecke, and R. Weigel, "Degradation of the conducted radio frequency immunity of microcontrollers due to electromagnetic resonances in foot-point loops," IEEE Transactions on Electromagnetic Compatibility, Vol. 54, 772-784, August 2012.


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