Vol. 70

Front:[PDF file] Back:[PDF file]
Latest Volume
All Volumes
All Issues
2018-07-12

Complex Permittivity Estimation for Each Layer in a BI-Layer Dielectric Material at Ku-Band Frequencies

By Lahcen Ait Benali, Abdelwahed Tribak, Jaouad Terhzaz, and Angel Mediavilla Sanchez
Progress In Electromagnetics Research M, Vol. 70, 109-116, 2018
doi:10.2528/PIERM18010813

Abstract

In this paper, a new measurement method is proposed to estimate the complex permittivity for each layer in a bi-layer dielectric material using a Ku-band rectangular waveguide WR62. The Sij-parameters at the reference planes in the rectangular waveguide loaded by a bi-layer material sample are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying the transmission lines theory, the expressions for these parameters as a function of complex permittivity of each layer are calculated. The Nelder-Mead algorithm is then used to estimate the complex permittivity of each layer by matching the measured and calculated the Sij-parameters. This method has been validated by estimating, at the Ku-band, the complex permittivity of each layer of three bi-layer dielectric materials. A comparison of estimated values of the complex permittivity obtained from bi-layer measurements and mono-layer measurements is presented.

Citation


Lahcen Ait Benali, Abdelwahed Tribak, Jaouad Terhzaz, and Angel Mediavilla Sanchez, "Complex Permittivity Estimation for Each Layer in a BI-Layer Dielectric Material at Ku-Band Frequencies," Progress In Electromagnetics Research M, Vol. 70, 109-116, 2018.
doi:10.2528/PIERM18010813
http://www.jpier.org/PIERM/pier.php?paper=18010813

References


    1. Gupta, K. and P. S. Hall, Analysis and Design of Integrated Circuit-Antenna Modules,, 247-248, Wiley, 1999.

    2. Chakravarty, S. and R. Mittra, "Application of the micro-genetic algorithm to the design of spatial filters with frequency-selective surfaces embedded in dielectric media," IEEE Trans. Electromagn. Compat., Vol. 44, No. 2, 338-346, 2002.
    doi:10.1109/TEMC.2002.1003399

    3. Deshpande, M. D. and K. Dudley, "Estimation of complex permittivity of composite multilayer material at microwave frequency using waveguide measurements," NASA Langley Res., 212-398, 2003.

    4. Ghodgaonkar, D. K., V. V. Varadan, and V. K. Varadan, "A freespace method for measurement of dielectric constants and loss tangents at microwave frequencies," IEEE Trans. Instrum. Meas., Vol. 38, 789-793, 1989.
    doi:10.1109/19.32194

    5. Ligthart, L. P., "A fast computational technique for accurate permittivity determination using transmission line methods," IEEE Trans. MTT, Vol. 31, No. 3, 249-254, 1983.
    doi:10.1109/TMTT.1983.1131471

    6. Hasar, U. C., "Permittivity measurement of thin dielectric materials from reflection-only measurements using one-port vector network analyzers," Progress In Electromagnetics Research, Vol. 95, 365-380, 2009.
    doi:10.2528/PIER09062501

    7. Hasar, U. C., "Unique permittivity determination of low-loss dielectric materials from transmission measurements at microwave frequencies," Progress In Electromagnetics Research, Vol. 107, 31-46, 2010.
    doi:10.2528/PIER10060805

    8. Baker-Jarvis, J., Transmission/Reflection and Short-Circuit Line permittivity Measurements, National Institute of Standards and Technology, Boulder, Colorado, 1990.

    9. Elmajid, H., J. Terhzaz, H. Ammor, M. Chabi, and A. Mediavilla, "A new method to determine the complex permittivity and complex permeability of dielectric materials at X-band frequencies," IJMOT, Vol. 10, No. 1, 34-39, 2015.

    10. Nelder, J. and R. Mead, "A simplex method for function minimization," Computer SXSX Journal, Vol. 7, No. 4, 308-313, 1965.
    doi:10.1093/comjnl/7.4.308

    11., Optimization Toolbox User’s Guide, The MathWorks, Version 7.5, 2016.