1. Zoughi, R., Microwave Non-destructive Testing and Evaluation, Kluwer Academic Publishers, Dordrecht, The Netherlands, 2000.
2. Blitz, J., Electrical and Magnetic Methods of Non-destructive Testing, Chapman & Hall, London, UK, 1997.
3. Carriveau, G. W. and R. Zoughi, "Nondestructive evaluation and characterization of complex composite structures," Proc. 11th Int. Sym. on Nondestructive Characterization of Materials, 273-280, Berlin, Germany, 2002.
4. Zoughi, R. and M. Lujan, "Nondestructive microwave thickness measurement of dielectric slabs," Mater. Eval., Vol. 48, 1100-1105, 1990.
5. Bakhtiari, S., S. I. Ganchev, and R. Zoughi, "Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slabs backed by a conducting plate," IEEE Trans. Instrum. Meas., Vol. 42, No. 1, 19-24, 1993.
doi:10.1109/19.206673
6. Zoughi, R. and S. Bakhtiari, "Microwave nondestructive detection and evaluation of disbonding and elamination in layered dielectric slabs," IEEE Trans. Instrum. Meas., Vol. 39, No. 6, 1059-1063, 1990.
doi:10.1109/19.65826
7. Ganchev, S. I., N. Qaddoumi, E. Ranu, and R. Zoughi, "Microwave detection optimization of disbond in layered dielectrics with varying thickness," IEEE Trans. Instrum. Meas., Vol. 44, No. 2, 326-328, 1995.
doi:10.1109/19.377843
8. Lavelle, T. M., "Microwaves in nondestructive testing," Mater. Eval., Vol. 25, 254-258, 1967.
9. Botsco, R. J., "Nondestructive testing of plastics with microwaves," Mater. Eval., Vol. 27, 25A-32A, 1969.
10. Mondal, J. P. and T. H. Chen, "Propagation constant determination in microwave fixture de-embedding procedure," IEEE Trans. Microw. Theo. Tech., Vol. 36, No. 4, 706-713, 1988.
doi:10.1109/22.3575
11. Baek, K. H., H. Y. Sung, and W. S. Park, "A 3-position transmission/reflection method for measuring the permittivity of low loss materials ," IEEE Microw. Guided Wave Lett., Vol. 5, No. 1, 3-5, 1995.
doi:10.1109/75.382378
12. Lee, M. Q. and S. Nam, "An accurate broadband measurement of substrate dielectric constant," IEEE Microw. Guided Wave Lett., Vol. 6, No. 4, 168-170, 1996.
doi:10.1109/75.481077
13. Janezic, M. D. and J. A. Jargon, "Complex permittivity determination from propagation constant measurements," IEEE Microw. Guided Wave Lett., Vol. 9, No. 2, 76-78, 1999.
doi:10.1109/75.755052
14. Huygen, I., C. Steukers, and F. Duhamel, "A wideband line-line dielectrometric method for liquids, soils, and planar substrates," IEEE Trans. Instrum. Meas., Vol. 50, No. 5, 1343-1348, 2001.
doi:10.1109/19.963208
15. Wan, C., B. Nauwelaers, W. De Raedt, and M. Van Rossum, "Two new measurement methods for explicit determination of complex permittivity," IEEE Trans. Microwave Theory Tech., Vol. 46, No. 11, 1614-1619, 1998.
doi:10.1109/22.734537
16. Reynoso-Hernandez, J. A., C. F. Estrada-Maldonado, T. Parra, K. Grenier, and J. Graffeuil, "An improved method for estimation of the wave propagation constant γ in broadband uniform millimeter wave transmission line," Microwave Opt. Technol. Lett., Vol. 22, No. 4, 268-271, 1999.
doi:10.1002/(SICI)1098-2760(19990820)22:4<268::AID-MOP16>3.0.CO;2-6
17. Hasar, U. C., "A new calibration-independent method for complex permittivity extraction of solid dielectric materials," IEEE Microw. Wireless Compon. Lett., Vol. 44, No. 9, 585-587, 2008.
18. Hasar, U. C., "A new calibration-independent method for complex permittivity extraction of solid dielectric materials," IEEE Microw. Wireless Compon. Lett., Vol. 18, No. 12, 788-790, 2008.
doi:10.1109/LMWC.2008.2007699
19. Hasar, U. C., "A calibration-independent method for broadband and accurate complex permittivity determination of liquid materials," Rev. Sci. Instrum., Vol. 79, No. 9, 086114-1-086114-3, 2008.
20. Wu, Y., Z. Tang, Y. Yu, and X. He, "A new method to avoid acrowding phenomenon in extracting the permittivity of ferroelectric thin films," Progress In Electromagnetics Research Letters, Vol. 4, 159-166, 2008.
doi:10.2528/PIERL08091402
21. He, X., Z. Tang, B. Zhang, and Y. Wu, "A new deembedding method in permittivity measurement of ferroelectric thin film material," Progress In Electromagnetics Research Letters, Vol. 3, 1-8, 2008.
doi:10.2528/PIERL08011501
22. Kurokawa, K., "Power waves and the scattering matrix," IEEE Trans. Microw. Theory Tech., Vol. 13, 194-202, 1965.
doi:10.1109/TMTT.1965.1125964
23. Hasar, U. C. and O. Simsek, "A calibration-independent method for position-insensitive and nonsingular dielectric measurements of solid materials," J. Phys. D: Applied Phys., Vol. 42, 075403-075412, 2009.
doi:10.1088/0022-3727/42/7/075403
24. Engen, G. F. and C. A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microwave Theory Tech., Vol. 27, No. 12, 987-993, 1979.
doi:10.1109/TMTT.1979.1129778
25. Hoer, C. A. and G. F. Engen, "Calibrating a dual six-port of fourport for measuring two-ports with any connectors," IEEE MTT-S Int. Microwave Symp. Dig., 665-668, Baltimore, MD, 1986.
26. Hasar, U. C., "Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials," Meas. Sci. Techol., Vol. 19, No. 5, 055706-055715, 2008.
doi:10.1088/0957-0233/19/5/055706
27. Baker-Jarvis, J., "Transmission/reflection and short-circuit line permittivity measurements," Natl. Inst. Stand. Technol., Boulder, CO, Tech. Note 1341, 1990.
28. Baker-Jarvis, J., M. D. Janezic, J. H. Grosvenor, and R. G. Geyer, "Transmission/reflection and short-circuit line methods for measuring permittivity and permeability," Natl. Inst. Stand. Technol., Boulder, CO, Tech. Note 1355, 1992.
29. Von Hippel, A. R., Dielectric Materials and Applications, John Wiley & Sons, New York, NY, 1954.
30. Hasar, U. C., "A self-checking technique for materials characterization using calibration-independent measurements of reflecting lines," Microw. Opt. Technol. Lett., Vol. 51, No. 1, 129-132, 2009.
doi:10.1002/mop.23978
31. Buyukozturk, O., T. Y. Yu, and J. A. Ortega, "A methodology for determining complex permittivity of construction materials based on transmission-only coherent, wide-bandwidth free-space measurements," Cem. Concr. Compos., Vol. 28, No. 4, 349-359, 2006.
doi:10.1016/j.cemconcomp.2006.02.004
32. Hasar, U. C., "Free-space nondestructive characterization of young mortar samples," J. Mater. Civ. Eng., Vol. 19, No. 8, 674-682, 2007.
doi:10.1061/(ASCE)0899-1561(2007)19:8(674)
33. Challa, R. K., D. Kajfez, J. R. Gladden, and A. Z. Elsherbeni, "Permittivity measurement with as non-standard waveguide by using TRL calibration and fractional linear data fitting," Progress In Electromagnetics Research B, Vol. 2, 1-13, 2008.
doi:10.2528/PIERB07102001
34. Khalaj-Amirhosseini, K., "Closed form solutions for nonuniform transmission lines," Progress In Electromagnetics Research B, Vol. 2, 243-258, 2008.
doi:10.2528/PIERB07111502