volume | PIER Journals

Abstract

In this paper, an improved TRL (Thru-Reflect-Line) calibration method is presented. This method is based on ten-term error model of a two-port vector network analyzer(VNA) measurement system. Eight error terms induced by fixtures as well as two leakage errors are derived directly from the S parameters of the calibration standards measured from the coaxial reference plane without converting S parameters to T parameters. To validate our algorithm, a microstrip device with a via hole and a coplanar waveguide transmission line are fabricated and calibrated using the present TRL calibration method and Engen's algorithm, respectively. The magnitudes and phases of S₁₁ and S₂₁ of the devices are compared. The consistency of the de-embedded results with those calibrated by Engen's TRL algorithm illustrates the validity of the TRL algorithm in this paper.

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Mr. Yu Liu

Dr. Ling Tong

Dr. Yu Tian

Dr. Bo Gao