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2011-05-09

Improved Spurious Free Performance of Multi-Layer Multipermittivity Dielectric Resonator in MIC Environment

By Raghvendra Kumar Chaudhary, Vishwa V. Mishra, Kumar Vaibhav Srivastava, and Animesh Biswas
Progress In Electromagnetics Research B, Vol. 30, 135-156, 2011
doi:10.2528/PIERB11032908

Abstract

In this paper, a novel approach has been suggested to obtain an improved spurious-free window for dielectric resonator in microwave integrated circuit environment. In microwave integrated circuit environment, the dielectric resonator placed on a thin dielectric substrate gets located asymmetrically with respect to its shielding enclosure. A reduced separation in frequencies (mode separation) is one of a consequence of this asymmetry that may become a cause of spurious modes. This adverse influence of asymmetry is sought to be compensated by proposing a multi-layer multi-permittivity dielectric resonator structure with several layers of differing permittivity. The suggested approach takes advantage of the fact that the mode separation of a dielectric resonator configuration can be correlated to relevant resonance mode fields. By perturbing the resonance mode fields through the suggested multi-layer multi-permittivity approach, the adverse influence of asymmetry is found to reduce considerably over a comparative conventional ring dielectric resonator in microwave integrated circuit configuration. Still more improvement in mode separation are shown when the shape of the multi-layer multi-permittivity ring dielectric resonator is further modified, suggesting a scope for optimization in present approach.

Citation


Raghvendra Kumar Chaudhary, Vishwa V. Mishra, Kumar Vaibhav Srivastava, and Animesh Biswas, "Improved Spurious Free Performance of Multi-Layer Multipermittivity Dielectric Resonator in MIC Environment," Progress In Electromagnetics Research B, Vol. 30, 135-156, 2011.
doi:10.2528/PIERB11032908
http://www.jpier.org/PIERB/pier.php?paper=11032908

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