Vol. 65

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2016-01-20

New De-Embedding Method with Look-Up Table for Characterization of High Speed Interconnects

By Shaowu Huang and Beomtaek Lee
Progress In Electromagnetics Research B, Vol. 65, 129-141, 2016
doi:10.2528/PIERB15110602

Abstract

In this paper, a new de-embedding technique with Look-Up Table (LUT) is proposed for accurate and efficient characterization of interconnects, particularly printed circuit board (PCB) transmission lines including microstrip and stripline. LUT is pre-created to cover various fixture effects including the reference structures inside and/or outside test printed circuit boards (PCBs). The pre-established LUT is introduced to eliminate the errors of ``probing and launching fixtures'' in characterization of transmission lines. It is applied to characterization of loss of microstrip and stripline. Simulations and measurements are performed to verify its accuracy and feasibility. Results show it is in good agreement with conventional Delta-L like methods but significantly reduces the cost of characterization. It provides an accurate but cost-effective solution for characterization of high speed interconnects, in particular for high volume manufacturing environments.

Citation


Shaowu Huang and Beomtaek Lee, "New De-Embedding Method with Look-Up Table for Characterization of High Speed Interconnects," Progress In Electromagnetics Research B, Vol. 65, 129-141, 2016.
doi:10.2528/PIERB15110602
http://www.jpier.org/PIERB/pier.php?paper=15110602

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