In this paper, we investigate the diffraction of complex structures applying a new hybridization between generalized PO (Physical Optic) and MoM-GEC method. The proposed approach is developed to speed up convergence, alleviate calculation and then provide a considerable gain in requirements (processing time and memory storage) because it is based on a single test function instead of numerous sinusoidal or polynomial ones. Based on this approach, each metallic pattern is modeled by a current trial function that consists of two parts. The first part is called modal current, and it is decomposed on Hankel functions for modeling metal edges. However, the second part concerns the middle of metallic patterns, and it is modeled by PO method and called generalized PO current. Based on this approach, we study the diffraction of unidimensional structures, then we generalize our approach to take bidimensional ones. For validation purpose, we investigate 1D and 2D reflectarrays to prove the new approach's benefits. The obtained results show good accuracy with the method of moments. Moreover, we prove the considerable improvements in CPU time and memory storage achieved by the hybrid approach when studying these structures.
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