PIER
 
Progress In Electromagnetics Research
ISSN: 1070-4698, E-ISSN: 1559-8985
Home | Search | Notification | Authors | Submission | PIERS Home | EM Academy
Home > Vol. 68 > pp. 297-315

ANALYSIS OF V TRANSMISSION LINES RESPONSE TO EXTERNAL ELECTROMAGNETIC FIELDS

By A. Cheldavi and P. Nayeri

Full Article PDF (358 KB)

Abstract:
In the present paper the response of V transmission line to electromagnetic illumination has been obtained. Also in order to determine the VTL frequency operation band for both TE and TM modes a Gaussian pulse source has been applied to the structure. The VTL structure has received considerable attention in high frequency and microwave IC packaging. The purpose of this study is to determine high frequency design considerations in order to reduce the effects of electromagnetic interference (EMI) on the VTL structure and maintain the desired performance. It was observed that the effect of incident EM waves on the V lines performance is considerably lower than conventional microstrips, however the V lines are more sensitive to sources at close proximity. In addition, although the V lines show lower dispersion at higher frequencies, their frequency operation band is limited by a resonance like behavior which is directly related to the V groove dimensions. The full wave analysis is carried out using the Yee-cell based 2 Dimensional Finite Difference Time Domain method (2D-FDTD), while enforcing a very stable and efficient mesh truncation technique.

Citation:
A. Cheldavi and P. Nayeri, "Analysis of V Transmission Lines Response to External Electromagnetic Fields," Progress In Electromagnetics Research, Vol. 68, 297-315, 2007.
doi:10.2528/PIER06093003
http://www.jpier.org/PIER/pier.php?paper=06093003

References:
1. Schutt-Aine, J. E., "Static analysis of V transmission lines," IEEE Trans. Microwave Theory Tech., Vol. MTT-40, No. 4, 659-664, 1992.
doi:10.1109/22.127513

2. Asheh, C. B., D. Bhattacharya, and R. Garg, "Characterization of V-groove coupled microshield line," IEEE Micro. Wireless Comp. Letters, Vol. 15, No. 2, 110-112, 2005.
doi:10.1109/LMWC.2004.842849

3. Yuan, N. C., C. L. Ruan, and W. G. Lin, "Analytical analyses of V, elliptic, and circular-shaped microshield transmission lines," IEEE Trans. Microwave Theory Tech., Vol. MTT-42, No. 5, 855-859, 1994.
doi:10.1109/22.293535

4. Keshmiri, F., G. Dadashzadeh, A. Cheldavi, and P. Nayeri, "A Novel method for analysis of V-transmission lines," Antem/Ursi, 16-19, 2006.

5. Cheldavi, A. and P. Nayeri, "Circualr symmetric multiconductor V-shaped transmission line: A new type fo microwave intercon- nects," J. of Electromagnetic Waves and Appl., Vol. 20, No. 4, 461-474, 2006.
doi:10.1163/156939306776117045

6. Ramahi, O. M., A. Z. Elsherbeni, and C. E. Smith, "Dynamic analysis of V transmission lines," IEEE Trans. Comp. Packaging and Man. Tech., Vol. 21, No. 3, 250-257, 1998.
doi:10.1109/96.704935

7. Xiao, S., R. Vahldieck, and H. Jin, "Full-wave analysis of guided wave structures using a novel 2-D FDTD," IEEE Microwave Guide Wave Lett., Vol. 2, No. 5, 165-167, 1992.
doi:10.1109/75.134342

8. Sheen, D. M., S. M. Ali, M. D. Abouzahra, and J. A. Kong, "Application of the three-dimensional finite-difference time- domain method to the analysis of planar microstrip circuits," IEEE Trans. Micorwave Theory Tech., Vol. 38, No. 7, 849-857, 1990.
doi:10.1109/22.55775

9. Taflove, A. and S. Hagness, Computational Electrodynamics: The Finite Difference Time Domain Method, 2nd ed., Artech House, 2000.

10. Sadiku, M. N. O., Numerical Techniques in Electromagnetics, 186-190, 2nd ed., 186-190, CRC Press LLC., FL, 2001.

11. Waldschmidt, T., "Range of effective action radius of a hard source field component in a 2D-FDTD grid," IEEE Microwave & Guided Wave Lett., 217-219, 2000.
doi:10.1109/75.852420

12. Mezzanotte, P., L. Roselli, and R. Sorrentino, "A simple way to model curved metal boundaries in FDTD algorithm avoiding staircase approximation," IEEE Microwave Guide Wave Lett., Vol. 5, No. 8, 267-269, 1995.
doi:10.1109/75.401071

13. Balanis, C. A., Advanced Engineering Electromagnetics, 444-457, John Willey & Sons, 1989.


© Copyright 2014 EMW Publishing. All Rights Reserved