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Enhancement of the Electronic Confinement Improves the Mobility in P-n -P Delta-Doped Quantum Wells in Si
Progress In Electromagnetics Research Letters, Vol. 1, 167-172, 2008
The electronic structure and mobility trends in a n-type delta-doped quantum well in Si, matched between p-type delta-doped barriers of the same material, is presented. The distance between the n-type well and p-type barriers is varied from 50A to 500A; and also the impurity density from 5 × 1012 cm-2 to 5 × 1013 cm-2, for both, donors and acceptors. An increase in the mobility by a factor of 1.6 at interwell distance of 50A with donor and acceptor concentrations of 5 × 1012 cm-2 and 5 × 1013 cm-2 compared with a single delta-doped well without p-type barriers is found. This improvement in mobility could be attributed to a better confinement of carriers, which favors excited levels with nodes in the donor plane. This trade-off between carrier concentration and mobility could be exploited in high-speed, high-power and high-frequency applications.
Augusto Ariza-Flores, and Isaac Rodríguez-Vargas, "Enhancement of the Electronic Confinement Improves the Mobility in P-n -P Delta-Doped Quantum Wells in Si," Progress In Electromagnetics Research Letters, Vol. 1, 167-172, 2008.

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