A technique that allows to locate defective elements in planar arrays by using some samples of the degraded far-field power pattern is described. This approach uses genetic algorithms to minimize the square of the difference between the far-field power pattern obtained for a given configuration of failed elements and the measured one. The method also allows to detect defective elements that don't fail completely
2. Peters, T. J., "Conjugate gradient-based algorithm to minimize the sidelobe level of planar arrays with element failures," IEEE Trans. Antennas Propagat., Vol. 39, 1497-1504, 1991.
3. Rodrıguez, J. A. and F. Ares, "Optimization of the performance of arrays with failed elements using the simulated annealing technique," J. Electromagn. Waves Appl., Vol. 12, 1625-1637, 1998.
4. Yeo, B. and Y. Lu, "Array failure correction with a genetic algorithm," IEEE Trans. Antennas Propagat., Vol. 47, 823-828, 1999.
5. Rahmat-Samii, Y., E. Michielssen, and Eds., Electromagnetic Optimization by Genetic Algorithms, John Wiley & Sons, Inc., New York, USA, 1999.
6. Rodrıguez, J. A. and F. Ares, "Sıntesis de diagramas de radiaci´on de una antena para GNSS,", CASA Space Division, Madrid, Spain, Tech. Rep. USC/GNSS/RPT/001, March 1999.