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Progress In Electromagnetics Research
ISSN: 1070-4698, E-ISSN: 1559-8985
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ESTIMATING THE REDUCTION OF RADIATED EMISSIONS FROM TFT-LCD PANEL USING NETWORK ANALYZER WITH A BULK CURRENT INJECTION PROBE

By C.-Y. Ho, K.-S. Chen, T.-S. Horng, and J.-M. Wu

Full Article PDF (838 KB)

Abstract:
A network analyzer with a bulk current injection (BCI) probe is proposed to measure the common-mode conversion coefficient for DC supply loops on a driver PCB of thin film transistor-liquid crystal display (TFT-LCD) panel. The proposed technique is used to predict the common-mode radiated emission caused by the DC supply loops, which highly correlates with the radiated emission measurements obtained for the TFT-LCD panel in a fully anechoic chamber (FAC). The proposed technique is also successful to estimate the reduction of a specific peak in the radiated emission spectrum by shielding the DC supply loops on a driver PCB of TFT-LCD panel. Electromagnetic simulation and equivalent-circuit modeling approaches are developed to confirm the common-mode radiation mechanism in this study.

Citation:
C.-Y. Ho, K.-S. Chen, T.-S. Horng, and J.-M. Wu, "Estimating the Reduction of Radiated Emissions from Tft-Lcd Panel Using Network Analyzer with a Bulk Current Injection Probe," Progress In Electromagnetics Research, Vol. 140, 181-197, 2013.
doi:10.2528/PIER13041115
http://www.jpier.org/PIER/pier.php?paper=13041115

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