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SCATTERING BY MULTILAYERED STRUCTURES USING THE EXTENDED METHOD OF AUXILIARY SOURCES EMAS

By N. Hichem and T. Aguili

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Abstract:
In this paper, an electromagnetic model based upon the method of auxiliary sources is developed around multilayered structures without any restriction of physical and geometrical macroscopic parameters. Thus, the multilayered structure is considered as a superposition of a finite number of strongly coupled and recovered layers. The extended method of auxiliary sources EMAS is tested for a dielectric shell, a multilayered dielectric cylinder for different medium conductivities and a conducting cylinder coated with a dielectric or a metamaterial. Furthermore, we validate that the coupling between far layers can be neglected for lossy mediums. Numerical results computed in this paper reveal the validity and the accuracy of the aforementioned model in comparison with moment and hybrid methods.

Citation:
N. Hichem and T. Aguili, "Scattering by Multilayered Structures Using the Extended Method of Auxiliary Sources Emas," Progress In Electromagnetics Research B, Vol. 15, 133-150, 2009.
doi:10.2528/PIERB09042307

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