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INFLUENCE OF MEASURED SCATTERING PARAMETERS ON THE CONVOLUTION SIMULATION OF NONLINEAR LOADED HIGH-SPEED MICROSTRIP INTERCONNECTS

By C. M. F. Cárdenas and A. D. Jimenez

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Abstract:
The simulation of nonlinear loaded high-speed microstrip interconnects by means of a convolution-based procedure is described when both, analytical and measured scattering parameters are used. Closed-form equations are employed to obtain the analytical scattering parameters. The influence of measured scattering parameters, when these are used instead the analytical ones, is investigated to know how the microstrip interconnect responses are affected. The convolution procedure is complemented by including the transmission line linear equation and the microwave circuit reflection theory. S

Citation:
C. M. F. Cárdenas and A. D. Jimenez, "Influence of Measured Scattering Parameters on the Convolution Simulation of Nonlinear Loaded High-Speed Microstrip Interconnects," Progress In Electromagnetics Research M, Vol. 19, 77-90, 2011.
doi:10.2528/PIERM11050608

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