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2013-06-03

Improved Immunity Measurement of a Microcontroller to Conducted Continuous Wave Interference

By Fayu Wan, Jun-Xiang Ge, Yong Zhou, and Bing Yu
Progress In Electromagnetics Research M, Vol. 31, 117-127, 2013
doi:10.2528/PIERM13041902

Abstract

This paper discusses an improved in-situ immunity measurement test bench of a microcontroller -PIC18F458 to conducted continuous wave interference (CWI). The updated measurement algorithm gives more accurate measurement result. Compared with normal failure criterion, the DC shift failure criterion is adopted because it gives better description of the immunity behavior of the microcontroller. Finally, the susceptibility results are explained in detail.

Citation


Fayu Wan, Jun-Xiang Ge, Yong Zhou, and Bing Yu, "Improved Immunity Measurement of a Microcontroller to Conducted Continuous Wave Interference," Progress In Electromagnetics Research M, Vol. 31, 117-127, 2013.
doi:10.2528/PIERM13041902
http://www.jpier.org/PIERM/pier.php?paper=13041902

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