volume | PIER Journals

Abstract

Modifications in the measurement of the complex permittivity are described, based on the transmission and reflection coefficients of a dielectric slab. The measurement uses TRL twoport calibration to bring the reference planes accurately to the sample surface. The complex permittivity as a function of frequency is computed by minimizing the difference between the measured and the ideal scattering parameters. An alternative procedure for determining the complex permittivity uses the fractional linear data fitting to a Qcircle of the virtual short-circuit and/or virtual open circuit data. In that case, the sample must be a multiple of one-quarter wavelength long within the measured range of frequencies. Comparison with results obtained by other traditional procedures is provided.

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Dr. Ravi Challa

Dr. Darko Kajfez

Dr. Veysel Demir

Dr. Joseph Gladden

Professor Atef Elsherbeni