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PIER PIER B PIER C PIER M PIER Letters PIER Photonics
2012-05-12
Improvement of Electrical Near-Field Measurements with an Electro-Optic Test Bench
By
David Chevallier,

    Mr. David Chevallier

    IRSEEM, EA 4353

    Graduate School of Engineering ESIGELEC

    France

    Homepage

David Baudry,

    Dr. David Baudry

    IRSEEM/ESIGELEC

    France

    Homepage

Anne Louis

    Dr. Anne Louis

    Engineering School ESIGELEC

    France

    Homepage

Progress In Electromagnetics Research B, Vol. 40, 381-398, 2012
doi:10.2528/PIERB12020107 | Google Scholar

Abstract
In this paper, two different kinds of near-field measurement techniques are presented. The first one uses coaxial probes that do not give precise measurements on microelectronic devices. We saw in [1] that the spatial resolution of these probes reach 500 μm for monopole and is millimetric for dipole probe. The second one is based on the Pockels effect that converts an electromagnetic (EM) field into optical modulation. Our objective is to improve the Ex/Ey near-field measurement with this second technique. The performance of the electro-optic (EO) probe is compared with dipole probes of 2.5 and 5 mm with the use of simulations and measurements, on a wire above a ground plane and on coupled microstrip lines. At the end, a discussion about the technical limitations of the EO probe is made.
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Citation
David Chevallier, David Baudry, and Anne Louis, "Improvement of Electrical Near-Field Measurements with an Electro-Optic Test Bench," Progress In Electromagnetics Research B, Vol. 40, 381-398, 2012.
doi:10.2528/PIERB12020107
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