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Conducted Emission Measurement of a Cell Phone Processor Module
Progress In Electromagnetics Research C, Vol. 42, 191-203, 2013
This paper discusses a conducted emission measurement of a cell phone integrated circuit. The industry standard measurement method is used to compare the measurement result to the defined limit line. A data analysis method-short time fast Fourier transform (STFFT) is presented to help to analyze the result. The data consistency and repeatability is also analyzed.
Fayu Wan, Jun-Xiang Ge, and Mengxiang Qu, "Conducted Emission Measurement of a Cell Phone Processor Module," Progress In Electromagnetics Research C, Vol. 42, 191-203, 2013.

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