College of Electronics and Information Engineering
Nanjing University of Information Science and Technology
China
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Jiangsu Key Laboratory of Meteorological Observation and Information Processing
Nanjing University of Information Science and Technology
China
Homepage1. Bendhia, S., M. Ramdani, and E. Sicard, Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility, Springer-Verlag, Berlin, Germany, 2006.
doi:10.1007/b137864
2. Ramdani, M., E. Sicard, et al. "The electromagnetic compatibility of integrated circuits --- Past, present and future," IEEE Trans. on Electromagnetic Compatibility, Vol. 51, No. 1, 78-100, Feb. 2009.
doi:10.1109/TEMC.2008.2008907 Google Scholar
3. IEC "IEC 61967-4, integrated circuits --- Measurement of electromagnetic emissions 150 kHz to 1 GHz --- Part 4: Measurement of conducted emissions ---1 Ω/150 Ω direct coupling method,"-2005.
doi:10.1109/TEMC.2008.2008907 Google Scholar
4. BISS "Generic IC EMC test specification version 1.2,", Jan. 2010. Google Scholar
5. Ramanujan, A., Z. Riah, A. Louis, and B. Mazari, "Computational optimizations towards an accurate and rapid electromagnetic emission modeling," Progress In Electromagnetics Research B, Vol. 27, 365-384, 2011. Google Scholar
6. Pan, W. and D. Pommerenke, "EMI failure analysis techniques: II. Joint time-frequency analysis," IEEE EMC Society News Letter, Vol. 226, No. 2010, 31-34, 2010. Google Scholar
7. Ross, B., "IBIS models for signal integrity applications," Electrical Engineering Times, 38-43, Sep. 2, 1996. Google Scholar
8. Tchrani, P. F., Y. Z. Chen, and J. Y. Fang, "Extraction of transient behavioral model of digital I/O buffers from IBIS," 46th IEEE Electronic Components & Technology Conference, 1009-1015, Orlando, May 28-31, 1996. Google Scholar
9. Tuinenga, P. W., SPICE: A Guide to Circuit Simulation & Analysis Using PSpice, Englewood Cliffs, Prentice-Hall, NJ, 1992.
