2014-03-07
Multilayered Superlenses Containing Csbr or Active Medium for Subwavelength Photolithography
By
Progress In Electromagnetics Research B, Vol. 59, 1-18, 2014
Abstract
The characteristics of periodic multilayered near-field superlenses are analyzed and optimized, using the dispersion relation derived from an effective medium theory and the transfer function in the spectral domain. The k'z-k''x and kz-kx contours are used to explain and predict the spectral width, amplitude and phase of the transfer function. Superlenses containing CsBr or active layers are proposed to reduce image distortion or to compensate for the propagation loss, respectively. The parameters of the superlenses can be optimized by simulations to resolve half-pitch features down to λ/36 using CsBr layers, and λ/20 using active layers.
Citation
Li-Hao Yeh, and Jean-Fu Kiang, "Multilayered Superlenses Containing Csbr or Active Medium for Subwavelength Photolithography," Progress In Electromagnetics Research B, Vol. 59, 1-18, 2014.
doi:10.2528/PIERB13123101
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