volume | PIER Journals

Abstract

In this paper, an innovative technique for the determination of the dielectric properties of planar substrates is presented. Starting from a set of impedance measurements performed on a section of a microstrip transmission line built on the planar dielectric substrate under test, the proposed technique formulates the reconstruction problem in terms of an optimization one successively solved by means of an effective stochastic algorithm. Such a method allows one the reconstruction of the permittivity values at multiple frequencies by simply using a vector network analyzer and a standard calibration procedure for the impedance measurement. The results of some representative experimental tests are shown for a preliminary assessment of the effectiveness of the proposed approach.

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Dr. Renzo Azaro

Dr. Federico Caramanica

Prof. Giacomo Oliveri