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PIER PIER B PIER C PIER M PIER Letters PIER Photonics
2019-08-20
An Improved Algorithm for Deducing Complex Permittivity of Thin Dielectric Samples with the Transmission/Reflection Method
By
Minghui Ding,

    Dr. Minghui Ding

    Institute for Advanced Materials and Technology

    University of Science and Technology Beijing

    China

    Homepage

Yanqing Liu,

    Dr. Yanqing Liu

    Institute of Interdisciplinary Information Sciences

    Tsinghua University

    China

    Homepage

Xinru Lu,

    Dr. Xinru Lu

    University of Science and Technology Beijing

    China

    Homepage

Yifeng Li,

    Dr. Yifeng Li

    Institute of Laser Technology, Academy of Sciences of Hebei Province

    China

    Homepage

Weizhong Tang

    Dr. Weizhong Tang

    University of Science and Technology Beijing

    China

    Homepage

Progress In Electromagnetics Research M, Vol. 84, 1-9, 2019
doi:10.2528/PIERM19061802 | Google Scholar

Abstract
Transmission/reflection method is widely used in microwave engineering for determining dielectric properties of materials, and significant uncertainty will arise in the results if the thickness of the samples is small. In this paper, we propose animproved algorithm for deducing complex permittivity of thin dielectric samples with the transmission/reflection method. With the proposed algorithm, the real and imaginary parts of the complex permittivity will be treated separately, and two independent weighting factors, βre and βim, will be used to minimize the uncertainty in both parts ofthe complex permittivity. Numerical calculations as well as experimental measurements on undoped and boron-doped diamond films were conducted within the frequency range of 18.5-26.5 GHz to demonstrate the effectiveness of the algorithm. It is verified that among the various iterative algorithms which could be used to derive complex permittivity, the proposed algorithm is the most advantageous inreducing uncertaintieswhen thin dielectric samples are dealt with.
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Citation
Minghui Ding, Yanqing Liu, Xinru Lu, Yifeng Li, and Weizhong Tang, "An Improved Algorithm for Deducing Complex Permittivity of Thin Dielectric Samples with the Transmission/Reflection Method," Progress In Electromagnetics Research M, Vol. 84, 1-9, 2019.
doi:10.2528/PIERM19061802
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