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2009-06-11
Ellipsometry on a Planar S-Shape Metamaterial
By
Progress In Electromagnetics Research Letters, Vol. 9, 1-8, 2009
Abstract
In this paper we present the results of ellipsometry on a grid of S-shape particles engraved on an epoxy substrate. We show the value of the ellipticity and the tilt angle of the principal axis of ellipsis of the transmitted wave as a function to the angle between the polarisation of the incident plane wave and the principal axis of the particles. The optical axes of the material are found, and the dependence of the absorption to the angle of polarisation is shown. Using a least squares method with the measurements, we calculate the dichroism and the birefringence of the material.
Citation
Eric Verney, and Frank Gambou, "Ellipsometry on a Planar S-Shape Metamaterial," Progress In Electromagnetics Research Letters, Vol. 9, 1-8, 2009.
doi:10.2528/PIERL09050505
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