2009-11-19
Open Resonator Technique of Non-Planar Dielectric Objects at Millimeter Wavelengths
By
Progress In Electromagnetics Research M, Vol. 9, 185-197, 2009
Abstract
This paper provides a reliable dielectric measurement theory of the open resonator for non-planar objects such as convex-concave objects. It is the first time that the complete analytical formulas of the complex permittivity are presented by means of the second-order theory of the open resonator and field matching method. Furthermore, a measurement system is designed and built at Ka band, and the consistency of the results between planar and non-planar samples verifies the accuracy of the new theory. Finally, the experimental error analysis is investigated.
Citation
Yong Feng Gui, Wen-Bin Dou, and Kai Yin, "Open Resonator Technique of Non-Planar Dielectric Objects at Millimeter Wavelengths," Progress In Electromagnetics Research M, Vol. 9, 185-197, 2009.
doi:10.2528/PIERM09071804
References

1. Weir, W. B., "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, Vol. 62, No. 1, 33-36, Jan. 1974.
doi:10.1109/PROC.1974.9382        Google Scholar

2. Boughriet, A. H., C. Legrand, and A. Chapoton, "Noniterative stable transmission/reflection method for low-loss material complex permittivity determination," IEEE Trans. Microwave Theory Tech., Vol. 45, No. 1, 52-57, 1997.
doi:10.1109/22.552032        Google Scholar

3. Cook, R. J., "Microwave cavity methods," High Frequency Dielectric Measurement, J. Chamberlain and G. W. Chantry (eds.), I. P. C. Science and Technology Press, London, England, 1973.        Google Scholar

4. Cullen, A. L. and P. K. Yu, "The accurate measurement of permittivity by means of an open resonator," Proc. R. Soc. Lond. A, Vol. 325, 493-509, 1971.
doi:10.1098/rspa.1971.0181        Google Scholar

5. Zoughi, R., Microwave Nondestructive Testing and Evaluation, Kluwer Academic Publishers, 2000.

6. Mosig, J. R., J. E. Besson, M. Gex-farby, et al. "Reflection of an open-ended coaxial line and application to nondestructive measurement of materials," IEEE Trans. Instrum. Meas., Vol. 30, No. 1, 46-51, 1981.        Google Scholar

7. Decreton, M. C. and F. E. Gardiol, "Simple nondestructive method for measurement of complex permittivity," IEEE Trans. Instrum. Meas., Vol. 23, No. 6, 434-438, Dec. 1974.
doi:10.1109/TIM.1974.4314329        Google Scholar

8. Bakhtiari, S., S. Ganchev, and R. Zoughi, "Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slabs backed by a conducting plate," IEEE Trans. Instrum. Meas., Vol. 42, No. 1, 19-24, Feb. 1993.
doi:10.1109/19.206673        Google Scholar

9. Ghodgaonkar, D. K., V. V. Varadan, and V. K. Varadan, "A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies," IEEE Trans. Instrum. Meas., Vol. 37, 789-793, 1989.
doi:10.1109/19.32194        Google Scholar

10. Varadan, V. V. and V. K. Varadan, "In situ microwave characterization of nonplanar dielectric objects," IEEE Trans. Microwave Theory Tech., Vol. 48, No. 3, 388-394, 2000.
doi:10.1109/22.826837        Google Scholar

11. Yu, P. K. and A. L. Cullen, "Measurement of permittivity by means of an open resonator: I. theoretical," Proc. R. Soc. Lond. A, Vol. 380, 49-71, 1982.

12. Jones, R. G., "Precise dielectric measurements at 35 GHz using an open microwave resonator," Proc. Inst. Elec. Eng., Vol. 123, 285-290, Apr. 1976.        Google Scholar

13. Hirvonen, T. M., P. Vainikainen, A. Lozowski, and A. V. Raisanen, "Measurement of dielectrics at 100 GHz with an open resonator connected to a network analyzer," IEEE Trans. Instrum. Meas., Vol. 45, 780-786, Aug. 1996.
doi:10.1109/19.516996        Google Scholar

14. Chan, W. F. P. and B. Chambers, "Measurement of nonplanar dielectric samples using an open resonator," IEEE Trans. Microwave Theory Tech., Vol. 35, 1429-1434, Dec. 1987.
doi:10.1109/TMTT.1987.1133871        Google Scholar

15. Cullen, A. L. and P. K. Yu, "Complex source-point theory of the electromagnetic open resonator," Proceedings of the Royal Society of London, Series A, Mathematical and Physical Sciences, Vol. 366, No. 1725, 155-171, 1979.
doi:10.1098/rspa.1979.0045        Google Scholar

16. Hodgson, N. and H. Weber, Optical Resonators, Springer-Verlag, 1997.

17. Deleniv, A. N. and S. Gevorgian, "Open resonator technique for measuring multilayered dielectric plates," IEEE Trans. Microwave Theory Tech., Vol. 53, No. 9, 2908-2916, Sep. 2005.
doi:10.1109/TMTT.2005.854242        Google Scholar

18. Gui, Y. F., W. B. Dou, P. G. Su, and K. Yin, "The improvement of the open resonator technique for precise dielectric measurement at millimeter wavelengths," IET Microwaves Antennas & Propagation, Accepted.        Google Scholar

19. Gui, Y. F., W. B. Dou, K. Yin, and P. G. Su, "Open resonator system for automatic and precise dielectric measurement at millimeter wavelengths," Int. J. Infrared Milli. Waves, Vol. 29, 782-791, 2008.
doi:10.1007/s10762-008-9374-5        Google Scholar

20. Afsar, M. N., "Millimeter-wave dielectric measurement of materials," Proc. IEEE, Vol. 73, No. 1, 131-153, Jan. 1985.

21. Bogle, A., M. Havrilla, D. Nyquis, L. Kempel, and E. Rothwell, "Electromagnetic material characterization using a partially-filled rectangular waveguide," Journal Electromagnetic Wave and Applications, Vol. 19, No. 10, 1291-1306, 2005.
doi:10.1163/156939305775525909        Google Scholar

22. Chala, R. K., D. Kajfez, V. Demir, J. R. Gladden, and A. Z. Elsherbeni, "Permittivity measurement with a non-standard waveguide by using TRL calibration and fractional linear data," Progress In Electromagnetics Research B, Vol. 2, 1-13, 2008.
doi:10.2528/PIERB07102001        Google Scholar

23. Kumar, A. and S. Sharma, "Measurement of dielectric constant and loss factor of the dielectric materials at microwave frequencies," Progress In Electromagnetics Research, Vol. 69, 47-54, 2007.
doi:10.2528/PIER06111204        Google Scholar

24. Moradi, G. and A. Abdipour, "Measuring the permittivity of dielectric materials using STDR approach," Progress In Electromagnetics Research, Vol. 77, 357-365, 2007.
doi:10.2528/PIER07080201        Google Scholar

25. Strickland, J., Time Domain Reflectometry Measurements, Tektroni, .        Google Scholar