1. Weir, W. B., "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, Vol. 62, No. 1, 33-36, Jan. 1974.
doi:10.1109/PROC.1974.9382 Google Scholar
2. Boughriet, A. H., C. Legrand, and A. Chapoton, "Noniterative stable transmission/reflection method for low-loss material complex permittivity determination," IEEE Trans. Microwave Theory Tech., Vol. 45, No. 1, 52-57, 1997.
doi:10.1109/22.552032 Google Scholar
3. Cook, R. J., "Microwave cavity methods," High Frequency Dielectric Measurement, J. Chamberlain and G. W. Chantry (eds.), I. P. C. Science and Technology Press, London, England, 1973. Google Scholar
4. Cullen, A. L. and P. K. Yu, "The accurate measurement of permittivity by means of an open resonator," Proc. R. Soc. Lond. A, Vol. 325, 493-509, 1971.
doi:10.1098/rspa.1971.0181 Google Scholar
5. Zoughi, R., Microwave Nondestructive Testing and Evaluation, Kluwer Academic Publishers, 2000.
6. Mosig, J. R., J. E. Besson, M. Gex-farby, et al. "Reflection of an open-ended coaxial line and application to nondestructive measurement of materials," IEEE Trans. Instrum. Meas., Vol. 30, No. 1, 46-51, 1981. Google Scholar
7. Decreton, M. C. and F. E. Gardiol, "Simple nondestructive method for measurement of complex permittivity," IEEE Trans. Instrum. Meas., Vol. 23, No. 6, 434-438, Dec. 1974.
doi:10.1109/TIM.1974.4314329 Google Scholar
8. Bakhtiari, S., S. Ganchev, and R. Zoughi, "Open-ended rectangular waveguide for nondestructive thickness measurement and variation detection of lossy dielectric slabs backed by a conducting plate," IEEE Trans. Instrum. Meas., Vol. 42, No. 1, 19-24, Feb. 1993.
doi:10.1109/19.206673 Google Scholar
9. Ghodgaonkar, D. K., V. V. Varadan, and V. K. Varadan, "A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies," IEEE Trans. Instrum. Meas., Vol. 37, 789-793, 1989.
doi:10.1109/19.32194 Google Scholar
10. Varadan, V. V. and V. K. Varadan, "In situ microwave characterization of nonplanar dielectric objects," IEEE Trans. Microwave Theory Tech., Vol. 48, No. 3, 388-394, 2000.
doi:10.1109/22.826837 Google Scholar
11. Yu, P. K. and A. L. Cullen, "Measurement of permittivity by means of an open resonator: I. theoretical," Proc. R. Soc. Lond. A, Vol. 380, 49-71, 1982.
12. Jones, R. G., "Precise dielectric measurements at 35 GHz using an open microwave resonator," Proc. Inst. Elec. Eng., Vol. 123, 285-290, Apr. 1976. Google Scholar
13. Hirvonen, T. M., P. Vainikainen, A. Lozowski, and A. V. Raisanen, "Measurement of dielectrics at 100 GHz with an open resonator connected to a network analyzer," IEEE Trans. Instrum. Meas., Vol. 45, 780-786, Aug. 1996.
doi:10.1109/19.516996 Google Scholar
14. Chan, W. F. P. and B. Chambers, "Measurement of nonplanar dielectric samples using an open resonator," IEEE Trans. Microwave Theory Tech., Vol. 35, 1429-1434, Dec. 1987.
doi:10.1109/TMTT.1987.1133871 Google Scholar
15. Cullen, A. L. and P. K. Yu, "Complex source-point theory of the electromagnetic open resonator," Proceedings of the Royal Society of London, Series A, Mathematical and Physical Sciences, Vol. 366, No. 1725, 155-171, 1979.
doi:10.1098/rspa.1979.0045 Google Scholar
16. Hodgson, N. and H. Weber, Optical Resonators, Springer-Verlag, 1997.
17. Deleniv, A. N. and S. Gevorgian, "Open resonator technique for measuring multilayered dielectric plates," IEEE Trans. Microwave Theory Tech., Vol. 53, No. 9, 2908-2916, Sep. 2005.
doi:10.1109/TMTT.2005.854242 Google Scholar
18. Gui, Y. F., W. B. Dou, P. G. Su, and K. Yin, "The improvement of the open resonator technique for precise dielectric measurement at millimeter wavelengths," IET Microwaves Antennas & Propagation, Accepted. Google Scholar
19. Gui, Y. F., W. B. Dou, K. Yin, and P. G. Su, "Open resonator system for automatic and precise dielectric measurement at millimeter wavelengths," Int. J. Infrared Milli. Waves, Vol. 29, 782-791, 2008.
doi:10.1007/s10762-008-9374-5 Google Scholar
20. Afsar, M. N., "Millimeter-wave dielectric measurement of materials," Proc. IEEE, Vol. 73, No. 1, 131-153, Jan. 1985.
21. Bogle, A., M. Havrilla, D. Nyquis, L. Kempel, and E. Rothwell, "Electromagnetic material characterization using a partially-filled rectangular waveguide," Journal Electromagnetic Wave and Applications, Vol. 19, No. 10, 1291-1306, 2005.
doi:10.1163/156939305775525909 Google Scholar
22. Chala, R. K., D. Kajfez, V. Demir, J. R. Gladden, and A. Z. Elsherbeni, "Permittivity measurement with a non-standard waveguide by using TRL calibration and fractional linear data," Progress In Electromagnetics Research B, Vol. 2, 1-13, 2008.
doi:10.2528/PIERB07102001 Google Scholar
23. Kumar, A. and S. Sharma, "Measurement of dielectric constant and loss factor of the dielectric materials at microwave frequencies," Progress In Electromagnetics Research, Vol. 69, 47-54, 2007.
doi:10.2528/PIER06111204 Google Scholar
24. Moradi, G. and A. Abdipour, "Measuring the permittivity of dielectric materials using STDR approach," Progress In Electromagnetics Research, Vol. 77, 357-365, 2007.
doi:10.2528/PIER07080201 Google Scholar
25. Strickland, J., Time Domain Reflectometry Measurements, Tektroni, . Google Scholar