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PIER PIER B PIER C PIER M PIER Letters PIER Photonics
2018-04-03
Insertable Waveguide Verification Standards for the Electromagnetic Characterization of Materials
By
Jonathan L. Frasch,

    Dr. Jonathan L. Frasch

    Raytheon Company

    USA

    Homepage

Edward J. Rothwell,

    Professor Edward J. Rothwell

    Department of Electrical and Computer Engineering

    Michigan State University

    USA

    Homepage

Premjeet Chahal,

    Dr. Premjeet Chahal

    Department of Electrical and Computer Engineering

    Michigan State University

    USA

    Homepage

John Doroshewitz

    Dr. John Doroshewitz

    Department of Electrical and Computer Engineering

    Michigan State University

    USA

    Homepage

Progress In Electromagnetics Research M, Vol. 66, 183-191, 2018
doi:10.2528/PIERM17111304 | Google Scholar

Abstract
A process is introduced to design and validate insertable rectangular-waveguide verification standards for the electromagnetic characterization of materials using the Nicolson-Ross-Weir method. Each insertable structure consists of a series of metal steps that acts as a surrogate material exhibiting smooth and predictable permittivity and permeability characteristics across the waveguide band. These known material properties can be used to assess the performance of material characterization systems. Since the verification standards are inserted into the waveguide in the same manner as samples under test, each step in the normal measurement procedure is duplicated. A specific example of an S-band verification standard is presented, with the standard fabricated using two different methods. The first standard is machined from a solid metal block while the second is constructed by metalizing a 3-D printed polymer structure. Comparison of the predicted material parameters to those extracted from experimental data demonstrates the utility of the proposed insertable standards.
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Citation
Jonathan L. Frasch, Edward J. Rothwell, Premjeet Chahal, and John Doroshewitz, "Insertable Waveguide Verification Standards for the Electromagnetic Characterization of Materials," Progress In Electromagnetics Research M, Vol. 66, 183-191, 2018.
doi:10.2528/PIERM17111304
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