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PIER PIER B PIER C PIER M PIER Letters PIER Photonics
2018-03-16
Analysis of Polarization Interference-Type BPF Arrays for NIR Spectroscopic Imaging Utilizing All-Dielectric Planar Chiral Metamaterials
By
Yasuo Ohtera,

    Prof. Yasuo Ohtera

    Grad Sch Engn

    Tohoku Univ

    Japan

    Homepage

Jiyao Yu,

    Dr. Jiyao Yu

    Graduate School of Engineering

    Tohoku University

    Japan

    Homepage

Hirohito Yamada

    Dr. Hirohito Yamada

    Department of Electrical and Communication Engineering, Graduate School of Engineering

    Tohoku University

    Japan

    Homepage

Progress In Electromagnetics Research M, Vol. 66, 1-10, 2018
doi:10.2528/PIERM17112707 | Google Scholar

Abstract
We investigated the potential application of planar chiral metamaterials (PCMs) to near infrared wavelength filters for multispectral measurement through electromagnetic simulation. PCM assumed here was a two-dimensional sub-wavelength surface grating on a high index film with chiral unit cells. The PCM exhibits optical activity (OA) for normally incident light at a finite wavelength range. Thus, by sandwiching the PCM with a pair of linear polarizers, a polarization interference-type BPF can be constructed. We focused on an all-dielectric PCM consisting of a silicon chiral layer and a dielectric underclad layer on a silica substrate. Wavelength filtering characteristics with different bandwidths have been verified for several underclad materials such as Si3N4, Al2O3, and Si.
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Citation
Yasuo Ohtera, Jiyao Yu, and Hirohito Yamada, "Analysis of Polarization Interference-Type BPF Arrays for NIR Spectroscopic Imaging Utilizing All-Dielectric Planar Chiral Metamaterials," Progress In Electromagnetics Research M, Vol. 66, 1-10, 2018.
doi:10.2528/PIERM17112707
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