volume | PIER Journals

Abstract

We analyzed the effect of loss and coupling to EIT metamaterials using circuit approach, giving the effect of two parameters: coupling and loss on the resonant property of the EIT metamaterials. To verify the results of the circuit analysis, simulations and experiments were performed. The structures were fabricated with superconducting NbN and varied temperature to verify the effect of loss. The distances were adjusted to observe the effect of the coupling strength. The results of simulations and experiments were consistent with the circuit analysis.

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Dr. Yonggang Zhang

Dr. Chun Li

Dr. Xuecou Tu