volume | PIER Journals

Abstract

This paper discusses an improved in-situ immunity measurement test bench of a microcontroller -PIC18F458 to conducted continuous wave interference (CWI). The updated measurement algorithm gives more accurate measurement result. Compared with normal failure criterion, the DC shift failure criterion is adopted because it gives better description of the immunity behavior of the microcontroller. Finally, the susceptibility results are explained in detail.

1. IEC EMC Task Force "Direct RF power injection to measure the immunity against conducted RF-disturbances of integrated circuits up to 1 GHz,", IEC Draft Tech. Rep., IEC 62132-3, Aug. 2001.
doi:10.1109/TEMC.2008.918983 Google Scholar

2. Chahine, I., M. Kadi, E. Gaboriaud, A. Louis, and B. Mazari, "Characterization and modeling of the susceptibility on integrated circuits to conducted electromagnetic disturbance up to 1 GHz," IEEE Trans. Electromagn. Compat., Vol. 50, No. 2, 285-293, May 2008.
doi:10.1049/iet-smt:20060142 Google Scholar

3. Chahine, I., M. Kadi, E. Gaboriaud, X. Gallenne, A. Louis, and B. Mazari, "Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances," IET Sci. Meas. Technol., Vol. 1, No. 5, 240-244, Sep. 2007.
doi:10.1049/el:20073130 Google Scholar

4. Boyer, A., E. Sicard, and S. Bendhia, "Characterization of electromagnetic susceptibility of integrated circuits using near-field scan," IET Electron. Lett., Vol. 43, No. 1, 15-16, Jan. 2007.
doi:10.1109/TEMC.2007.911920 Google Scholar

5. Alaeldine, A., R. Perdriau, M. Ramdani, J. Levant, and M. Drissi, "A direct power injection model for immunity prediction in integrated circuits," IEEE Trans. Electromagn. Compat., Vol. 50, No. 2, 52-62, Feb. 2008.
doi:10.2528/PIERB11020802 Google Scholar

6. Paez, E., C. Tremola, and M. A. Azpurua, "A proposed method for quantifying uncertainty in RF immunity testing due to EUT presence," Progress In Electromagnetics Research B, Vol. 29, 175-190, 2011.
doi:10.1109/81.989173 Google Scholar

7. Fiori, F. and P. S. Crovetti, "Nonlinear effects of radio-frequency interference in operational amplifier," IEEE Trans. on Circuits Syst. I, Vol. 49, No. 3, 367-372, Mar. 2002. Google Scholar

8. Wan, F., F. Duval, X. Savatier, A. Louis, and B. Mazari, "Study of susceptibility of an MCU control system in the automotive field," Asia-Pacific Int. Symp. on EMC, 610-613, Beijing, China, Apr. 2010. Google Scholar

9. Sketoe, J. G., Integrated Circuit Electromagnetic Immunity Handbook, National Aeronautics and Space Administration, Marshall Space Flight Center , 2000.

10. Boyer, A., S. Bendhia, and E. Sicard, "Modeling of a mixed signal processor susceptibility to near-field aggression," IEEE Symp. on EMC, 1-5, Honolulu, USA, Jul. 2007.
doi:10.1016/j.microrel.2009.06.013 Google Scholar

11. Gros, J.-B., G. Duchamp, A. Meresse, and J.-L. Levant, "Electromagnetic immunity model of an ADC for microcontroller's reliability improvement," Micro. Rel., Vol. 49, No. 9-11, 963-966, Sep. 2009.
doi:10.1049/el.2010.2988 Google Scholar

12. Wan, F., F. Duval, X. Savatier, A. Louis, and B. Mazari, "Effects of conducted electromagnetic interference on an analog-to-digital converter," IET Electron. Lett., Vol. 47, No. 1, 23-25, Jan. 23-25, 2011. Google Scholar

13. Redoute, J. and M. Steyaert, EMC of Analog Integrated Circuits, Springer, Berlin, 2009.
doi:10.1007/b137864

14. Bendhia, S., M. Ramdani, and E. Sicard, Electromagnetic Compatibility of Integrated Circuits, Techniques for Low Emission and Susceptibility, Springer-Verlag, Berlin, Germany, 2006.

Professor Fayu Wan

Dr. Jun-Xiang Ge

Dr. Yong Zhou

Dr. Bing Yu