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2013-08-21
Failure Mode Characterization in Inkjet-Printed CPW Lines Utilizing a High-Frequency Network Analyzer and Post-Processed TDR Analysis
By
Progress In Electromagnetics Research C, Vol. 43, 1-14, 2013
Abstract
Failure mode characterization was applied to coplanar transmission lines by utilizing 0.5-10-GHz S-parameter measurements and post-calculated TDR (Time-Domain-Reflectometry) analysis. Coplanar waveguide transmission lines were inkjet-printed on 1.0-mm-thick flexible plastic RF substrates. Inductive, resistive, and capacitive types of failures-as the main failure modes caused by manufacturing, bending, or thermal cycling stresses-were investigated. The inkjet-printed CPW (Co-Planar Waveguide) lines were damaged by inductive shorts due to mechanical hits or resistive and capacitive failures due to bending of the substrate. By using the TDR method the type and physical location of the failure can be determined.
Citation
Sami Myllymaki Jussi Putaala Jari Hannu Heli Jantunen Matti Mantysalo Esa Kunnari , "Failure Mode Characterization in Inkjet-Printed CPW Lines Utilizing a High-Frequency Network Analyzer and Post-Processed TDR Analysis," Progress In Electromagnetics Research C, Vol. 43, 1-14, 2013.
doi:10.2528/PIERC13052104
http://www.jpier.org/PIERC/pier.php?paper=13052104
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