1. Gold, G. and K. Helmreich, "Measuring design-DK and true permittivity of PCB materials up to 20 GHz," Microwave Conference, 154-157, IEEE, 2015. Google Scholar
2. Sheen, J., "Comparisons of microwave dielectric property measurements by transmission/reflection techniques and resonance techniques," Measurement Science and Technology, Vol. 20, No. 4, 042001, 2009.
doi:10.1088/0957-0233/20/4/042001 Google Scholar
3. Baker-Jarvis, J., E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Transactions on Microwave Theory and Techniques, Vol. 38, No. 8, 1096-1103, 1990.
doi:10.1109/22.57336 Google Scholar
4. Stuchly, S. S., M. A. Rzepecka, and M. F. Iskander, "Permittivity measurements at microwave frequencies using lumped elements," IEEE Transactions on Instrumentation and Measurement, Vol. 23, No. 1, 56-62, 1974.
doi:10.1109/TIM.1974.4314218 Google Scholar
5. Koul, A., M. Y. Koledintseva, S. Hinaga, et al. "Differential extrapolation method for separating dielectric and rough conductor losses in printed circuit boards," IEEE Transactions on Electromagnetic Compatibility, Vol. 54, No. 2, 421-433, 2012.
doi:10.1109/TEMC.2010.2087341 Google Scholar
6. Zhang, J., M. Y. Koledintseva, J. L. Drewniak, et al. "Reconstruction of dispersive dielectric properties for PCB substrates using a genetic algorithm," IEEE Transactions on Electromagnetic Compatibility, Vol. 50, No. 3, 704-714, 2008.
doi:10.1109/TEMC.2008.927923 Google Scholar
7. Huang, B.-K. and Q. Jia, "A method to extract dielectric parameters from transmission lines with conductor surface roughness at microwave frequencies," Progress In Electromagnetics Research M, Vol. 48, 1-8, 2016.
doi:10.2528/PIERM16030209 Google Scholar
8. Gold, G. and K. Helmreich, "A physical model for skin effect in rough surfaces," Microwave Integrated Circuits Conference, Vol. 8267, No. 1, 631-634, 2012. Google Scholar
9. Koledintseva, M. and A. Rakov, "Elimination of conductor foil roughness effects in characterization of dielectric properties of printed circuit boards," Design Con. 2014: Where the Chip Meets the Board, January 28-31, 2014. Google Scholar
10. Yang, B. B., M. Kirley, and J. H. Booske, "Theoretical and empirical evaluation of surface roughness effects on conductivity in the terahertz regime," IEEE Transactions on Terahertz Science and Technology, Vol. 4, No. 3, 368-375, 2014.
doi:10.1109/TTHZ.2014.2310121 Google Scholar
11. Pozar, D. M., Microwave Engineering, 4th Ed., Wiley, 2011.
12. Pollock, D. D., Physical Properties of Materials for Engineers, Taylor & Francis, 1993.