2020-12-27
A Novel Analytical Method Suitable for Coupled Electromagnetic Field of Circuit
By
Progress In Electromagnetics Research M, Vol. 100, 35-50, 2021
Abstract
A novel analytical method suitable for coupled electromagnetic field of a circuit is proposed in this paper. In a high frequency circuit and high-frequency converter, skin effects are obvious, and the variations in resistance and inductance values depend on frequency. In addition, the voltage and current distribution changes of a high frequency circuit generated with a high-frequency converter during dynamic switching process are complicated and depend on time. A novel analytical method suitable for coupled electromagnetic field of circuit in parameter optimization design of high-frequency circuit and high-frequency converter is proposed in this paper. The proposed method considers the influence of skin effect and coupled electromagnetic field on parameter variation simultaneously. According to the law between parameter variation and line length, the calculation process of parameter optimization will be simpler and more effective.
Citation
Rui Zhang, Yibo Wang, and Honghua Xu, "A Novel Analytical Method Suitable for Coupled Electromagnetic Field of Circuit," Progress In Electromagnetics Research M, Vol. 100, 35-50, 2021.
doi:10.2528/PIERM20072906
References

1. Giacoletto, L. J., "Frequency and time-domain analysis of skin effects," IEEE Transactions on Magnetics, Vol. 32, No. 1, 1996.
doi:10.1109/20.477574        Google Scholar

2. Stoll, R. L., Analysis of Eddy Currents, Clarendon Press, 1974.

3. Deswal, D. and F. de Leon, "Generalized circuit model for eddy current effects in multi-winding transformers," IEEE Transactions on Power Delivery, Vol. 34, No. 2, 2019.
doi:10.1109/TPWRD.2019.2896326        Google Scholar

4. Kakhki, M. T., J. Cros, and P. Viarouge, "New approach for accurate prediction of eddy current losses in laminated material in the presence of skin effect with 2-D FEA," IEEE Transactions on Magnetics, Vol. 52, No. 3, 2016.        Google Scholar

5. Lee, J.-H., N. M. Iyer, and H. Zhang, "Influence of skin effect on the current distribution of grounded-gate NMOS device," IEEE Electron Device Letters, Vol. 38, No. 11, 2017.        Google Scholar

6. Oh, K. S., "Accurate transient simulation of transmission lines with the skin effect," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 19, No. 3, 2000.
doi:10.1109/TCAD.2008.915533        Google Scholar

7. Ney, M. M. and G. I. Costache, "Transient striction and skin effects on voltage drop across flat conductors," Canadian Journal of Electrical and Computer Engineering, Vol. 18, No. 4, 1993.
doi:10.1109/CJECE.1993.6593947        Google Scholar

8. Coperich, K. M., A. E. Ruehli, and A. Cangellaris, "Enhanced skin effect for Partial-Element Equivalent-Circuit (PEEC) models," IEEE Transactions on Microwave Theory and Techniques, Vol. 48, No. 9, 2000.
doi:10.1109/22.868992        Google Scholar

9. Haas, H. and F. Schmoellebeck, "A finite-element method for transient skin effect in 2-D loaded multiconductor systems," IEEE Transactions on Magnetics, Vol. 24, No. 1, 1988.
doi:10.1109/20.43884        Google Scholar

10. Vu Dinh, T., B. Cabon, and J. Chilo, "New skin-effect equivalent circuit," Electronics Letters, Vol. 26, No. 19, 1990.
doi:10.1049/el:19901015        Google Scholar

11. Sato, K., N. Shinohara, and T. Naito, "A new transient analysis method of the electrical circuit containing with Skin Effect Element (SIC)," IEEE Transactions on Magnetics, Vol. 26, No. 2, 1990.
doi:10.1109/20.106486        Google Scholar

12. Ney, M. M., "Striction and skin effects on the internal impedance value of flat conductors," IEEE Transactions on Electromagnetic Compatibility, Vol. 33, No. 4, 1991.
doi:10.1109/15.99113        Google Scholar

13. Morisco, D. P., S. Kurz, H. Rapp, and A. Möckel, "A hybrid modeling approach for current diffusion in rectangular conductors," IEEE Transactions on Magnetics, Vol. 55, No. 9, 2019.
doi:10.1109/TMAG.2019.2914006        Google Scholar

14. Bai, F., Z. Niu, and D. Zhou, "Modeling and simulation of near-field radiation of power converters," Journal of System Simulation, Vol. 18, No. 2, 2006.        Google Scholar