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PIER PIER B PIER C PIER M PIER Letters PIER Photonics
2015-10-13
Low-Loss Complex Permittivity and Permeability Determination in Transmission/Reflection Measurements with Time-Domain Smoothing
By
Sung Kim,

    Dr. Sung Kim

    Physical Measurement Lab

    National Institute of Standards and Technology (NIST)

    USA

    Homepage

Jeffrey R. Guerrieri

    Dr. Jeffrey R. Guerrieri

    Radio Frequency Technology Division

    National Institute of Standards and Technology

    USA

    Homepage

Progress In Electromagnetics Research M, Vol. 44, 69-79, 2015
doi:10.2528/PIERM15073010 | Google Scholar

Abstract
An approach is proposed for determination of the complex permittivity and permeability of low-loss materials, eliminating half-wavelength resonances occurring in transmission/reflection (T/R) measurements. To this end, we apply the time-domain smoothing for removing resonant artifacts from the wave impedance obtained with the conventional T/R method, with an assumption that we do not have such artifacts in the refractive index. Accordingly, the permittivity and permeability are found from the smoothed wave impedance and conventional refractive index. In this paper, our method is validated by measurements for two different low-loss materials, nylon and lithium ferrite, and those results are discussed. Further, results from the present approach are compared to those from the approximate approach derived in our previous work.
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Citation
Sung Kim, and Jeffrey R. Guerrieri, "Low-Loss Complex Permittivity and Permeability Determination in Transmission/Reflection Measurements with Time-Domain Smoothing," Progress In Electromagnetics Research M, Vol. 44, 69-79, 2015.
doi:10.2528/PIERM15073010
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