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PIER PIER B PIER C PIER M PIER Letters PIER Photonics
2020-02-07
Analysis of ``False Non Reciprocity'' in 2-Port VNA Measurements of Reciprocal Devices
By
Leonardo Zappelli

    Dr. Leonardo Zappelli

    Dipartimento di Ingegneria dell'Informazione

    Universita Politecnica delle Marche

    Italy

    Homepage

Progress In Electromagnetics Research M, Vol. 90, 1-8, 2020
doi:10.2528/PIERM19110903 | Google Scholar

Abstract
The effect of measurement errors in the S-matrix of a reciprocal 2-port device is recognized in the (usually low) difference between S12 and S21, as the device were nonreciprocal. This ``false non-reciprocity'' is analyzed in the present paper, and it is verified that, for low loss device, the difference acts principally on the phases of S12 and S21. This anomaly can be removed if a numerical correction is applied to the experimental S-matrix. In doing so, it is proved that the residual measurement errors have comparable amplitudes on all scattering parameters.
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Citation
Leonardo Zappelli, "Analysis of ``False Non Reciprocity'' in 2-Port VNA Measurements of Reciprocal Devices," Progress In Electromagnetics Research M, Vol. 90, 1-8, 2020.
doi:10.2528/PIERM19110903
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