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2023-01-07
Statistics of Two Indicators for Multilook Scattering Signals from Multilayered Structures with Slightly Rough Interfaces
By
Richard Dusséaux,

    Professor Richard Dusséaux

    CNRS-UVSQ

    Université de Versailles-Saint-Quentin-en-Yvelines, LATMOS

    France

    Homepage

Saddek Afifi

    Prof. Saddek Afifi

    Department of Electronics

    Badji Mokhtar-Annaba University

    Algeria

    Homepage

Progress In Electromagnetics Research M, Vol. 115, 11-20, 2023
doi:10.2528/PIERM22092006 | Google Scholar

Abstract
Within the framework of the first-order small perturbation method, we derive the statistics of the layered rough surface index and the normalized difference polarization index for three-dimensional layered structure with slightly rough interfaces illuminated by a monochromatic plane wave and for multilook returns. We establish closed-form expressions for the probability density function and the cumulative distribution function. The first- and second-order moments are given by relation recurrences. We validate from Monte Carlo simulations the obtained theoretical formulas.
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Citation
Richard Dusséaux, and Saddek Afifi, "Statistics of Two Indicators for Multilook Scattering Signals from Multilayered Structures with Slightly Rough Interfaces," Progress In Electromagnetics Research M, Vol. 115, 11-20, 2023.
doi:10.2528/PIERM22092006
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