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PIER PIER B PIER C PIER M PIER Letters
2010-08-25
A Metric Function for Fast and Accurate Permittivity Determination of Low-to-High-Loss Materials from Reflection Measurements
By
Ugur Cem Hasar,

    Prof. Ugur Cem Hasar

    Electrical and Electronics Engineering

    Gaziantep University

    Turkey

    Homepage

Emin Argun Oral

    Dr. Emin Argun Oral

    Department of Electrical and Electronics Engineering

    Ataturk University

    Turkey

    Homepage

Progress In Electromagnetics Research, Vol. 107, 397-412, 2010
doi:10.2528/PIER10071308
Abstract
We have derived a one-variable metric function for fast and accurate complex permittivity extraction of low-to-high-loss materials using reflection-only microwave non-resonant measurements at one frequency. The metric function can be modified to facilitate fast computation of the complex permittivity of materials for various applications (e.g., relative complex permittivity measurement of low-loss materials). It is useful as a measurement tool for broadband measurements of complex permittivity of samples with substantiate lengths. In addition, the method is applicable for measurement of complex permittivity of dispersive materials or complex permittivity of non-dispersive samples in limited frequency-band applications, since it is based on point-by-point (or frequency-byfrequency) extraction. It is validated by a numerical analysis and measurements of a liquid sample.
Citation
Ugur Cem Hasar, and Emin Argun Oral, "A Metric Function for Fast and Accurate Permittivity Determination of Low-to-High-Loss Materials from Reflection Measurements," Progress In Electromagnetics Research, Vol. 107, 397-412, 2010.
doi:10.2528/PIER10071308
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