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PIER PIER B PIER C PIER M PIER Letters
2008-05-20
Support Vector Regression Machines to Evaluate Resonant Frequency of Elliptic Substrate Integrate Waveguide Resonators
By
Giovanni Angiulli,

    Dr. Giovanni Angiulli

    DIMET

    Univ. Mediterranea

    Italy

    Homepage

Domenico De Carlo,

    Dr. Domenico De Carlo

    DIMET

    University Mediterranea

    Italy

    Homepage

Giandomenico Amendola,

    Dr. Giandomenico Amendola

    Universita' della Calabria

    Italy

    Homepage

Emilio Arnieri,

    Dr. Emilio Arnieri

    DEIS

    Univ. Della Calabria

    Italy

    Homepage

Sandra Costanzo

    Dr. Sandra Costanzo

    Informatica e Sistemistica

    Universita della Calabria

    Italy

    Homepage

Progress In Electromagnetics Research, Vol. 83, 107-118, 2008
doi:10.2528/PIER08041803
Abstract
In this paper an efficient technique for the determination of the resonances of elliptic Substrate Integrated Waveguide (SIW) resonators is presented. The method is based on the implementation of Support Vector Regression Machines trained using a fast algorithm for the computation of the resonant frequencies of SIW structures. Results for resonators with a wide range of parameters will be presented. A comparison with results obtained with Multi Layer Perceptron Artificial Neural Network and with full wave simulations will show the effectiveness of the proposed approach.
Citation
Giovanni Angiulli, Domenico De Carlo, Giandomenico Amendola, Emilio Arnieri, and Sandra Costanzo, "Support Vector Regression Machines to Evaluate Resonant Frequency of Elliptic Substrate Integrate Waveguide Resonators," Progress In Electromagnetics Research, Vol. 83, 107-118, 2008.
doi:10.2528/PIER08041803
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