volume | PIER Journals

Abstract

The constitutive parameters measurement of thin solid and liquid materials by transmission-reflection methods generally suffers from a) the requirement of the transformation of measured scattering parameters from the reference plane to the end surfaces of the material (measurement plane) and b) inaccurate knowledge on the length of the material, if the material does not fill the entire measurement cell (a waveguide or coaxial-line section). In this research paper, a microwave waveguide method for constitutive parameters determination of these materials is proposed to simultaneously eliminate these problems. There are three main advantages of the proposed method as: a) it explicitly determines the constitutive parameters from measured S-parameters; b) it does not require the knowledge about sample length since it directly measures it as a byproduct of the method; and c) it offers a self-checking feature to trace the performance and accurateness of measurements. This feature does not depend on the constitutive parameters of the sample. We measured the complex permittivity of some thin solid and liquid test samples for validation of the method.

1. Nyfors, E. G. and P. Vainikainen, Industrial Microwave Sensors, Artech House, Inc., Norwood, MA, 1989.

2. Chen, L. F., C. K. Ong, C. P. Neo, et al. Microwave Electronics: Measurement and Materials Characterization, JohnWiley & Sons, West Sussex, England, 2004.

3. Hebeish, A. A., M. A. Elgamel, R. A. Abdelhady, et al. "Factors affecting the performance of the radar absorbant textile materials of different types and structures," Progress In Electromagnetics Research B, Vol. 3, 219-226, 2008.
doi:10.2528/PIERB07121702 Google Scholar

4. Zhang, H., S. Y. Tan, and H. S. Tan, "An improved method for microwave nondestructive dielectric measurement of layered media," Progress In Electromagnetics Research B, Vol. 10, 145-161, 2008.
doi:10.2528/PIERB08082701 Google Scholar

5. Pozar, D. M., Microwave Engineering, John Wiley & Sons, Inc., New York, NY, 2005.

6. Rubinger, C. P. L. and L. C. Costa, "Building a resonant cavity for the measurement of microwave dielectric permittivity of high loss materials," Microwave Opt. Tech. Lett., Vol. 49, 1687-1690, 2007.
doi:10.1002/mop.22506 Google Scholar

7. Williams, T. C., M. A. Stuchly, and P. Saville, "Modified transmission-reflection method for measuring constitutive parameters of thin flexible high-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 51, 1560-1566, 2003.
doi:10.1109/TMTT.2003.810139 Google Scholar

8. Courtney, C. C. and W. Motil, "One-port time-domain measurement of the approximate permittivity and permeability of materials," IEEE Trans. Microw. Theory Tech., Vol. 47, 551-555, 1999.
doi:10.1109/22.763154 Google Scholar

9. Weir, W. B., "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, Vol. 62, 33-36, 1974.
doi:10.1109/PROC.1974.9382 Google Scholar

10. Nicolson, A. M. and G. Ross, "Measurement of the intrinsic properties of materials by time-domain techniques," IEEE Trans. Instrum. Meas., Vol. 19, 377-382, 1970.
doi:10.1109/TIM.1970.4313932 Google Scholar

11. Packard, H., "Measuring dielectric constant of solids with the HP 8510 network analyzer,", Product Note 8510-3, 1985. Google Scholar

12. Baker-Jarvis, J., E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., Vol. 38, 1096-1103, 1990.
doi:10.1109/22.57336 Google Scholar

13. Baker-Jarvis, J., M. D. Janezic, J. H. Grosvenor, Jr., and R. G. Geyer, "Transmission/reflection and short-circuit line methods for measuring permittivity and permeability,", NIST, Boulder, CO, Tech. Note 1355, 1992.
doi:10.1109/22.57336 Google Scholar

14. Bois, K. J., L. F. Handjojo, A. D. Benally, K. Mubarak, and R. Zoughi, "Dielectric plug-loaded two-port transmission line measurement technique for dielectric property characterization of granular and liquid materials," IEEE Trans. Instrum. Meas., Vol. 48, 1141-1148, 1999.
doi:10.1109/19.816128 Google Scholar

15. Wang, Y. and M. N. Afsar, "Measurement of complex permittivity of liquids using waveguide techniques," Progress In Electromagnetics Research, PIER 42, 131-142, 2003. Google Scholar

16. Folgero, K., "Broad-band dielectric spectroscopy of lowpermittivity fluids using one measurement cell," IEEE Trans. Instrum. Meas., Vol. 47, 881-885, 1998.
doi:10.1109/19.744637 Google Scholar

17. Qaddoumi, N., S. Ganchev, and R. Zoughi, "Microwave diagnosis of low density glass fibers with resin binder," Res. Nondestruc. Eval., Vol. 8, 177-188, 1996. Google Scholar

18. Hasar, U. C., "Calibration-independent method for complex permittivity determination of liquid and granular materials," Electron. Lett., Vol. 44, 585-587, 2008.
doi:10.1049/el:20080242 Google Scholar

19. Baker-Jarvis, J., M. D. Janezic, and C. A. Jones, "Shielded opencircuited sample holder for dielectric measurements of solids and liquids," IEEE Trans. Instrum. Meas., Vol. 47, 338-344, 1998.
doi:10.1109/19.744172 Google Scholar

20. Vanzura, E. J., J. Baker-Jarvis, J. H. Grosvenor, and M. Janezic, "Intercomparison of permittivity measurements using the transmission/reflection method in 7-mm coaxial transmission lines," IEEE Trans. Microw. Theory Tech., Vol. 42, 2063-2070, 1994.
doi:10.1109/22.330120 Google Scholar

21. Mattar, K. E., D. G. Watters, and M. E. Brodwin, "Influence of wall contacts on measured complex permittivity spectra at coaxial line frequencies," IEEE Trans. Microw. Theory Tech., Vol. 39, 532-537, 1991.
doi:10.1109/22.75297 Google Scholar

22. Somlo, P. I., "A convenient self-checking method for the automated microwave measurement of μ and ε," IEEE Trans. Instrum. Meas., Vol. 42, 213-216, 1993.
doi:10.1109/19.278551 Google Scholar

23. Sjoberg, D., "Determination of propagation constants and material data from waveguide measurements," Progress In Electromagnetics Research B, Vol. 12, 163-182, 2009.
doi:10.2528/PIERB08121304 Google Scholar

24. Hasar, U. C., "Two novel amplitude-only methods for complex permittivity determination of medium- and low-loss materials," Meas. Sci. Techol., Vol. 19, 055706-055715, 2008.
doi:10.1088/0957-0233/19/5/055706 Google Scholar

25. Hasar, U. C., "A fast and accurate amplitude-only transmissionreflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 56, 2129-2135, 2008.
doi:10.1109/TMTT.2008.2002229 Google Scholar

26. Hasar, U. C. and C. R. Westgate, "A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 57, 471-477, 2009.
doi:10.1109/TMTT.2008.2011242 Google Scholar

27. Hasar, U. C. and O. Simsek, "An accurate complex permittivity method for thin dielectric materials," Progress In Electromagnetics Research, PIER 91, 123-183, 2009. Google Scholar

28. Buyukozturk, O., T. Y. Yu, and J. A. Ortega, "A methodology for determining complex permittivity of construction materials based on transmission-only coherent, wide-bandwidth free-space measurements," Cem. Concr. Compos., Vol. 28, 349-359, 2006.
doi:10.1016/j.cemconcomp.2006.02.004 Google Scholar

29. Ebara, H., T. Inoue, and O. Hashimoto, "Measurement method of complex permittivity and permeability for a powdered material using a waveguide in microwave band," Sci. Technol. Adv. Mat., Vol. 7, 77-83, 2006.
doi:10.1016/j.stam.2005.11.019 Google Scholar

30. Press, W. H., S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C: The Art of Scientific Computing, Cambridge University Press, 1992.

31. Balanis, C. A., Advanced Engineering Electromagnetics, John Wiley & Sons, 1989.

32. Deshpande, M. D., C. J. Reddy, P. I. Tiemsin, and R. Cravey, "A new approach to estimate complex permittivity of dielectric materials at microwave frequencies using waveguide measurements," IEEE Trans. Microw. Theory Tech., Vol. 45, 359-365, 1997.
doi:10.1109/22.563334 Google Scholar

33. Nishikata, A., "A swept-frequency measurement of complex permittivity and complex permeability of a columnar specimen inserted in a rectangular waveguide," IEEE Trans. Microw. Theory Tech., Vol. 55, 1554-1567, 2007.
doi:10.1109/TMTT.2007.900340 Google Scholar

34. He, X., Z. Tang, B. Zhang, and Y. Wu, "A new deembedding method in permittivity measurement of ferroelectric thin film material," Progress In Electromagnetics Research Letters, Vol. 3, 1-8, 2008.
doi:10.2528/PIERL08011501 Google Scholar

35. Wu, Y., Z. Tang, Y. Yu, and X. He, "A new method to avoid acrowding phenomenon in extracting the permittivity of ferroelectric thin films," Progress In Electromagnetics Research Letters, Vol. 4, 159-166, 2008.
doi:10.2528/PIERL08091402 Google Scholar

36. Hasar, U. C. and O. Simsek, "A simple approach for evaluating the reciprocity of materials without using any calibration standard," Progress In Electromagnetics Research, PIER 91, 139-152, 2009. Google Scholar

37. Engen, G. F. and C. A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Microw. Theory and Tech., Vol. 27, 987-993, 1979.
doi:10.1109/TMTT.1979.1129778 Google Scholar

38. Hasted, J. B., Aqueous Dielectrics, Chapman and Hall, 1973.

39. Chin, G. Y. and E. A. Mechtly, "Properties of materials," Reference Data for Engineering: Radio, Electronics, Computer, and Communications, E. C. Jordan (ed.), 4-20–4-23, Howard W. Sams & Co., Indianapolis, IN, 1986. Google Scholar

40. Von Hippel, A. R., Dielectric Materials and Applications, 134-135, 310-332, John Wiley & Sons, 1954.

Prof. Ugur Cem Hasar