volume | PIER Journals

Abstract

A perturbation method based on the decoupling of propagation and diffusion phenomenons is proposed in order to calculate losses in microwave structures. Starting from the first problem in which the conducting regions are not described, a perturbation is calculated by solving a second problem restricted to the vicinity of the conductors; iterations between these problems can be performed when the perturbed solution is not sufficiently accurate. The perturbation approach is however more accurate than a method based on a surface impedance model, without introducing the huge calculations that appear when both conducting region and external medium are described in a single problem. 2D examples are presented using the finite element method and the integral equation method.

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Dr. Damien Voyer

Dr. Ronan Perrussel

Dr. Patrick Dular