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PIER PIER B PIER C PIER M PIER Letters
2011-07-27
Superresolution Enhancement for the Superlens with Anti-Reflection and Phase Control Coatings via Surface Plasmons Modes of Asymmetric Structure
By
Pengfei Cao,

    Dr. Pengfei Cao

    School of Information Science and Engineering

    Lanzhou University

    China

    Homepage

Xiaoping Zhang,

    Dr. Xiaoping Zhang

    Lanzhou University

    China

    Homepage

Wei-Jie Kong,

    Dr. Wei-Jie Kong

    School of Information Science and Eng

    Lanzhou University

    China

    Homepage

Lin Cheng,

    Dr. Lin Cheng

    School of Information Science and Engineering

    Lanzhou University

    China

    Homepage

Hao Zhang

    Dr. Hao Zhang

    School of Information Science and Engineering

    Lanzhou University

    China

    Homepage

Progress In Electromagnetics Research, Vol. 119, 191-206, 2011
doi:10.2528/PIER11053010
Abstract
The paper discusses the reason why the image resolution can be significantly enhanced by the superlens with anti-reflection and phase control coatings (ARPC-superlens) via analyzing the surface plasmons (SPs) modes. ARPC-superlens is an asymmetric structure with finite thickness, in which we first find that there are two asymmetric SPs modes. By comparing the dispersion curve of SPs of ARPC-superlens and the SPs group velocity with their counterparts in the metric ones, we find that the Up Asymmetric Mode and Down Asymmetric Mode are excited within the ARPC-superlens with asymmetric structure. By simulating the aerial images in different SPs modes, the paper also discusses the optimal ratio between the metal slab and the ARPC coatings thickness. The results demonstrate that the subwavelength resolution of ARPC-superlens in Down Asymmetric Mode has been enhanced, when the metal/ARPC thickness ratio is 2:1.
Citation
Pengfei Cao, Xiaoping Zhang, Wei-Jie Kong, Lin Cheng, and Hao Zhang, "Superresolution Enhancement for the Superlens with Anti-Reflection and Phase Control Coatings via Surface Plasmons Modes of Asymmetric Structure," Progress In Electromagnetics Research, Vol. 119, 191-206, 2011.
doi:10.2528/PIER11053010
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