volume | PIER Journals

2013-06-04

Simple, Taylor-Based Worst-Case Model for Field-to-Line Coupling

Sjoerd T. Op 't Land,

Mr. Sjoerd T. Op 't Land

Groupe ESEO, EMC Research Group

France

Homepage

Mohamed Ramdani,

Dr. Mohamed Ramdani

Ecole Super Elect Ouest & Telecommun Rennes

France

Homepage

Richard Perdriau,

Dr. Richard Perdriau

Ecole Super Elect Ouest & Telecommun Rennes

France

Homepage

Marco Leone,

Prof. Marco Leone

Otto von Guericke University of Magdeburg

Germany

Homepage

Mhamed Drissi

Prof. Mhamed Drissi

INSA, CNRS

France

Homepage

Progress In Electromagnetics Research, Vol. 140, 297-311, 2013

doi:10.2528/PIER13041207 | Google Scholar

Abstract

To obtain Electromagnetic Compatibility (EMC), we would like to study the worst-case electromagnetic eld-induced voltages at the ends of Printed Circuit Board (PCB) traces. With increasing frequencies, modelling these traces as electrically short no longer suffices. Accurate long line models exist, but are too complicated to easily induce the worst case. Therefore, we need a simple analytical model. In this article, we predict the terminal voltages of an electrically long, two-wire transmission line with characteristic loads in vacuum, excited by a linearly polarised plane wave. The model consists of a short line model (one Taylor cell) with an intuitive correction factor for long line effects: the modified Taylor cell. We then adapt the model to the case of a PCB trace above a ground plane, illuminated by a grazing, vertically polarised wave. For this case, we prove that end-fire illumination constitutes the worst case. We derive the worst-case envelope and try to falsify it by measurement in a Gigahertz Transverse Electromagnetic (GTEM) cell.

Download Full Article (694) View Full Article volume

Citation

Copy Export

Sjoerd T. Op 't Land, Mohamed Ramdani, Richard Perdriau, Marco Leone, and Mhamed Drissi, "Simple, Taylor-Based Worst-Case Model for Field-to-Line Coupling," Progress In Electromagnetics Research, Vol. 140, 297-311, 2013.
doi:10.2528/PIER13041207

References

1. Lagos, J. L. and F. L. Fiori, "Worst-case induced disturbances in digital and analog interchip interconnects by an external electromagnetic plane wave --- Part I: Modeling and algorithm," IEEE Transactions on Electromagnetic Compatibility, Vol. 99, 1-7, 2010. Google Scholar

2. Magdowski, M. and R. Vick, "Closed-form formulas for the stochastic electromagnetic field coupling to a transmission line with arbitrary loads," IEEE Transactions on Electromagnetic Compatibility, Vol. 99, 1-7, 2012. Google Scholar

3. Nucci, C. A., F. Rachidi, and M. Rubinstein, "An overview of field-to-transmission line interaction," Applied Computational Electromagnetics Society Newsletter, Vol. 22, No. 1, 9-27, 2007. Google Scholar

4. Paul, C. R., Introduction to Electromagnetic Compatibility, Wiley, 2008.

5. Leone, M. and H. L. Singer, "On the coupling of an external electromagnetic field to a printed circuit board trace," IEEE Transactions on Electromagnetic Compatibility, Vol. 41, No. 4, 418-424, Nov. 1999.
doi:10.1109/15.809842 Google Scholar

6. Mandic, T., R. Gillon, B. Nauwelaers, and A. Baric, "Characterizing the TEM cell electric and magnetic field coupling to PCB transmission lines," IEEE Transactions on Electromagnetic Compatibility, Vol. 54, No. 5, 976-985, Oct. 2012.
doi:10.1109/TEMC.2012.2193888 Google Scholar

7. Taylor, C. D., R. S. Satterwhite, C. W. Harrison, and Jr., "The response of a terminated two-wire transmission line excited by a nonuniform electromagnetic field," IEEE Transactions on Antennas and Propagation, Vol. 13, No. 6, 987-989, Nov. 1965.
doi:10.1109/TAP.1965.1138574 Google Scholar

8. Agrawal, A. K., H. J. Price, and S. H. Gurbaxani, "Transient response of multiconductor transmission lines excited by a nonuni-form electromagnetic field," IEEE Transactions on Electromagnetic Compatibility, Vol. 22, No. 2, 119-129, May 1980.
doi:10.1109/TEMC.1980.303824 Google Scholar

9. Rachidi, F., "Formulation of the field-to-transmission line coupling equations in terms of magnetic excitation field," IEEE Transactions on Electromagnetic Compatibility, Vol. 35, No. 3, 404-407, Aug. 1993.
doi:10.1109/15.277316 Google Scholar

10. IEC 62132-2, , Integrated circuits --- Measurement of electromagnetic immunity 150 kHz to 1 GHz --- Part 2: Measurement of radiated immunity-TE, Jul. 2004.