volume | PIER Journals

Abstract

This work is aimed at presenting a methodology that exploits the scattered electromagnetic radiation collected on a measurement region outside the area under investigation to locate and characterize multiple unknown profiles. In many practical cases, an accurate quantitative imaging of the scenario under test is required and it can be reached by using a high resolution representation of the dielectric profile of the scatterers. Towards this aim, an enhanced iterative multi-resolution procedure that exploits a morphological processing for detecting and focusing on different non-connected regions-of-interest is developed. A suitable set of representative numerical results is presented for demonstrating that the proposed approach is able to efficiently detect the objects located in the test domain and to enhance the accuracy in reconstructing multiple scatterers.

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Dr. Davide Franceschini

Prof. Massimo Donelli

Dr. Paolo Rocca

Dr. Manuel Benedetti

Prof. Andrea Massa

Prof. Matteo Pastorino